[Proceedings 1992] IJCNN International Joint Conference on Neural Networks
DOI: 10.1109/ijcnn.1992.227160
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Depth perception from blurring-a neural networks based approach for automated visual inspection in VLSI wafer probing

Abstract: This paper presents a novel approach for the determination of depth as a function of blurring for automated visual inspection in VLSI wafer probing. There exists a smooth relationship between the degree of blur and the distance of a probe from a Test pad on a VLSI chip. Therefore, by measuring the amount of blurring, the distance from contact can be estimated. The effect of blurring on a point-object is studied in the frequency domain, and a monotonic relationship is found between the degree of blur and the fr… Show more

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