1981
DOI: 10.1103/physrevb.23.5511
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Depth-dependent eigenenergies and damping of excitonic polaritons near a semiconductor surface

Abstract: This paper reports the experimentally observed change of exciton-polariton eigenenergies near the surface of a semiconductor. Normal-incidence-reflection spectra and attenuated-totalreflection (ATR) spectra are measured in the n =1 exciton-polariton energy region. It is shown that ATR spectra probe regions near the surface whereas reflection spectra probe more deeply into the crystal bulk. Model calculations"which include spatial dispersion and depth-dependent eigenenergies and damping of excitonic polaritons,… Show more

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Cited by 147 publications
(93 citation statements)
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“…Our interpretation of the origin of exciton energy shifts in the PLD samples is in good agreement with theoretical descriptions of the effect of electric fields on exciton energies [18,19]. In reference 18, a universal curve relating the change in exciton energy to the electric field in the sample is given (as a multiple of the ionisation field, corresponding to a potential drop of 1 Rydberg across the exciton Bohr radius, when substantial exciton ionisation begins).…”
Section: Iv: Discussion / Analysis Of Resultssupporting
confidence: 63%
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“…Our interpretation of the origin of exciton energy shifts in the PLD samples is in good agreement with theoretical descriptions of the effect of electric fields on exciton energies [18,19]. In reference 18, a universal curve relating the change in exciton energy to the electric field in the sample is given (as a multiple of the ionisation field, corresponding to a potential drop of 1 Rydberg across the exciton Bohr radius, when substantial exciton ionisation begins).…”
Section: Iv: Discussion / Analysis Of Resultssupporting
confidence: 63%
“…The residual n-type carrier density in ZnO films grown by PLD on sapphire is generally in the range > 5 x 10 17 cm -3 [6,9] and the typical potential barriers between grains, associated with these depletion regions, is ~ 0.5 eV [21]. Using these figures and the static dielectric constant of ZnO [19], we can estimate that the electric fields in the depletion layers will be ~ 400 x 10 3 V/cm. Thus we are confident that the electric fields in our samples have values equal to or greater than the ionisation field for the excitons and that the consequent energy perturbations and damping predicted by theory are fully consistent with our data.…”
Section: Iv: Discussion / Analysis Of Resultsmentioning
confidence: 91%
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“…The resonant frequencies (for A, B, and C excitons) were taken as for a macroscopic ZnO crystal 20 with the resonance frequencies shifted to room temperature. We approximated the hexagonal ZnO nanowire by a nanowire cavity with a rectangular cross section with k⊥ ) π/d as the wavevector perpendicular to the nanowire long axis (d is the nanowire diameter).…”
mentioning
confidence: 99%
“…The exact energy of the excitonic transitions is neither the energy of the reflectivity maxima (see the position of transverse polaritons in Ref. 16) nor that of the peaks in the derivative of the absorption spectra. However, since the shape of the excitonic features appears to be not affected by the applied field, selecting arbitrary a position within the observed feature results only in a constant shift.…”
mentioning
confidence: 99%