2009
DOI: 10.1007/s10853-009-3388-9
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Deposition of thin cobalt films onto silicon by galvanostatic and potentiostatic techniques

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Cited by 15 publications
(4 citation statements)
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“…In addition, from the simulations, we found that the crystalline structure that fitted our experimental values corresponded to a faced-centered cubic (fcc). Other groups have observed that cobalt electrodeposited films onto different substrates exhibited both, hexagonal close-packed (hcp) and faced-centered cubic (fcc) structures [37][38][39], where the final crystallographic hcp/fcc ratio depended on the bath conditions and substrate characteristics. Although the hcp texture is more stable at lower temperatures, the fcc structure predicted by our model can be explained in terms of the substrate crystallographic orientation, which possible induced an epitaxial growth in the early stages of cluster formation [7], and also, has a much lower magnetocrystalline anisotropy than the hcp [39].…”
Section: Resultsmentioning
confidence: 99%
“…In addition, from the simulations, we found that the crystalline structure that fitted our experimental values corresponded to a faced-centered cubic (fcc). Other groups have observed that cobalt electrodeposited films onto different substrates exhibited both, hexagonal close-packed (hcp) and faced-centered cubic (fcc) structures [37][38][39], where the final crystallographic hcp/fcc ratio depended on the bath conditions and substrate characteristics. Although the hcp texture is more stable at lower temperatures, the fcc structure predicted by our model can be explained in terms of the substrate crystallographic orientation, which possible induced an epitaxial growth in the early stages of cluster formation [7], and also, has a much lower magnetocrystalline anisotropy than the hcp [39].…”
Section: Resultsmentioning
confidence: 99%
“…Munford et al [15,19] also verified this high cathodic to anodic charge relation. Several authors mentioned this phenomenon [24] but do not further discuss it. We will do it in a future paper.…”
Section: Current-voltage Characteristicmentioning
confidence: 99%
“…The effect of numerous parameters has been checked: concentration of the Co ions in the bath [15], influence of the presence of a thin oxide layer on the surface of the Si substrate [23], influence of the pH that control the crystallographic structure (hcp or fcc) of the films [7], current density, or applied potential. Other works studied the effect of the selected electrodeposition techniques (galvanostatic and potentiostatic techniques) onto magnetic properties [24], or used pulsed deposition techniques to improve film quality and properties [25,26]. The resistivity of the silicon wafer plays also a rule [17] and surface roughness can be modified by adding a surfactant an additive like saccharin to the bath [18].…”
Section: Introductionmentioning
confidence: 99%
“…They have been used as active materials in sensors, as reflective and refractive coatings for optical elements, as protective and decorative films [7][8][9] and as Fischer-Tropsch catalysts [10]. A variety of approaches have been used to synthesise cobalt films such as thermal evaporation [11][12][13], electron beam evaporation [14][15][16], sputtering [17,18], electro-deposition [19,20] and chemical vapour deposition (CVD) [21][22][23]. The CVD technique offers potential for producing films with high uniformity of thickness, high purity, conformal step coverage, minimal substrate damage, high growth rates and the possibility for selected area growth.…”
Section: Introductionmentioning
confidence: 99%