Modulation frequency and pulse duty cycle are two key parameters of pulsed VHF-PECVD technology. An experimental study on the microcrystalline silicon materials prepared by pulsed VHF-PECVD technology in high deposition rate is presented. And combining the diagnosis of plasma process with optical emission spectroscopy (OES), the dependence of microstructure and electrical properties of thin films on the pulse modulation frequency is discussed in detail.Recently the high-pressure VHF-PECVD with high input power [1,2] enables to achieve microcrystalline silicon thin film at high deposition rate. Meanwhile, the method will result in powder formation in the plasma, which deteriorates the quality of thin film. The deposition technology of microcrystalline silicon thin films by using pulsed PECVD method [3][4][5] can increase the deposition rate, and suppress dust formation. The 'on' and 'off' pulse modulation influences the chemical reactions in the plasma, and hence the high quality c-Si:H thin films and solar cells can be obtained [6][7][8] . In this paper, we study experimenally the effects of pulse modulation frequency on the structural, electrical characteristics and the growth rate of c -Si:H thin films.All c-Si:H thin films were prepared by using the Cluster CVD System with capacitive coupled plate electrodes at the background vacuum lower than 10 -5 Pa. The 70 MHz VHF power was modulated by square wave pulse at frequencies in the range 10 to 1000 kHz, with an 'on' time to 'off' time ratio of 80-90%. The dark and photo-currents of materials were measured by Keithley 617 at room temperature using Al coplanar contact electrode at dark condition and AM1.5 illumination, respectively, and then the conductivities were calculated. The crystalline volume fraction was evaluated by Raman scattering measurements. The glow of the plasma was monitored by optical emission spectroscopy (OES).As shown in Fig.1, the photo and dark conductivities of films prepared in the pulsed discharge at the modulation frequencies higher than 100 kHz almost maintain at the level of around 10 -4 s/cm and 10 -7 s/cm, respectively. At this circumstance, the pulse period is shorter than 10 ìs, especially the shorter off-time. Therefore, although plasma sheath collapses and the high temperature electron density drops rapidly a few ìs after the power is off [4] , the ions or radicals produced during the plasma on-time, especially the negative ions, have no time for their loss by ambipolar diffusion and by volume recombination and continue their production and Fig.1 Film conductivity and photosensitivity as a function of modulation frequency.