Deposition methods and process techniques for the fabrication of electrochromic all-solid-state devices

Muecke, Klaus; Boehm, Frank; Gambke, Thomas; Ottermann, C.; Bange, K.

doi:10.1117/12.22410

Cited by 5 publications

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“…at 2 =550nm. Both oftransmittance and colored efficiency are comparable with the results reported by literature 1 for BEV and RFSP. In addition, the deposition rate of reactive flash evaporation is much faster than the BEV and RFSP.…”

Section: Expuument Detailssupporting

confidence: 94%

<title>NiO coating for smart window application by reaction flash evaporation of nickel</title>

Xin¹,

Xin²

1996

Display Devices and Systems

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The technical feature of NiO coating produced by reaction flash evaporation of nickel is reported in this paper. The experimental result indicates that the integrated transmittance changes in value between colored and bleached state are 63.3% and 46.9% for a system of GI1TO/NiO in 2M KOH solution related with VIS and solar spectrum (AM1.5) respectively. It also exhibits fine control range of transmittance in NIR. In fact, electrochromic coating is comparable with NiO by radio frequency sputtering (RFSP) and electron beam reactive evaporation (BEV) for smart window application about coloration efficiency, deposition rate and EC response. The all solid state EC devices have been produced through reaction flash evaporation NiO coating combined with W03 coating and lithiated inorganic electrolyte. They exhibit a fine change range of VIS integrated transmittance over 52%. In this paper, the electrochromic mechanism ofNiOcoating is also discussed.

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Section: Expuument Detailssupporting

confidence: 94%

<title>NiO coating for smart window application by reaction flash evaporation of nickel</title>

Xin¹,

Xin²

1996

Display Devices and Systems

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“…The model used in this work to fit the experimental data is the amorphous semiconductor dispersion model proposed by Forouhi and Bloomer. In this model, the refractive index and extinction coefficient are given by: (5) There are five parameters in this model: A, B, C, Eg and . All the parameters have physical significance.…”

Section: Ellipsometry Measurementsmentioning

confidence: 99%

Spectroscopic ellipsometry study of effect of annealing on optical properties of sol-gel deposited WO 3 films

Barczynska

Bell

Skryabin

1994

Optical Interference Coatings

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In this investigation the dispestion relation of optical constants of sol-gel deposited hydrated tungsten oxide films have been measured using spectroscopic ellipsometry. The films were deposited on glass substrates from a tungsten butoxide precursor solution using a dip-coating technique and fired at three different temperatures: 200 C, 300C and 400'C. Ellipsometric measurements at 7 different angles of incidence and over the range 1.5-5eV have been made for each of the films.The amorphous semiconductor dispersion relation proposed by Forouhi and Bloomer was used to model the tungsten oxide optical constants and to fit the measured ellipsometric angles to determine the parameters in the model. The refractive index and extinction coefficient have been found using this procedure. Computer simulations of transmittance of the films, based on the optical constants obtained from the ellipsometric measurements and the fitting procedure, have been compared to the measured spectra. This comparison confirms that the optical constants found from ellipsometry describe the system accurately.The effect of increasing the annealing temperature of the films on the optical parameters is also discussed. In particular changes are observed in the optical energy gap and film thickness. The reasons for these variations is discussed in terms of the microstructure of the films.

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Properties and Characterization of Dielectric Thin Films

Bange¹,

Ottermann²,

Anderson³

2003

Schott Series on Glass and Glass Ceramics

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Deposition methods and process techniques for the fabrication of electrochromic all-solid-state devices

Cited by 5 publications

References 0 publications

<title>NiO coating for smart window application by reaction flash evaporation of nickel</title>

<title>NiO coating for smart window application by reaction flash evaporation of nickel</title>

Spectroscopic ellipsometry study of effect of annealing on optical properties of sol-gel deposited WO 3 films

Properties and Characterization of Dielectric Thin Films

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