Dependence of X-Ray Yields in Argon, Krypton, and Xenon upon the Charge State of Fluorine Ions at 35.7 MeV

Abstract

In high-velocity ion-atom single collisions, a strong dependence of target x-ray production cross sections upon the ionic charge state has been observed. Experiments were performed in thin gas targets of argon, krypton, and xenon with 35.7-MeV fluorine ions incident in charge states +5 to +9. Production cross sections for Ar K, Kr L, and Xe L characteristic lines increase by as much as a factor of 5 with increasing incident charge state but cannot be fitted by a q 2 dependence.

Production of projectile and targetK X-rays by single and multiple electron-capture in collisions of Si14+ and Si13+ ions with argon atoms at 4.5 and 5.5 MeV/amu

“…In most cases the X-ray yield versus the energy and the charge state of the projectile has been analyzed. The striking feature found in the charge state dependence of the target X-ray production is a large increase when the projectile brings one or two K-shell vacancies into the collision [2]. This effect has been interpretated as a consequence of the capture of a K-shell target electron into the empty shell of the projectile.…”

K-shell ionization cross sections in nearly symmetric collisions by S and Cl impact

“…They include the statistical errors, the ancertainties in the solid angle determination, and in the corrections applied to the x-ray yield and to the particle yield (due to target contaminants). The uncertainties due to the fluorescence yield, the target thickness effect [9] and the charge state effect [10] are difficult to asses. Using the information from [9][10][11] we deduce that our cross sections may be overestimated by 20 % for the lowest and 60 % for the highest bombarding energies.…”

“…The uncertainties due to the fluorescence yield, the target thickness effect [9] and the charge state effect [10] are difficult to asses. Using the information from [9][10][11] we deduce that our cross sections may be overestimated by 20 % for the lowest and 60 % for the highest bombarding energies. For the C1 on Ar measurements the uncertainty is believed to be smaller, since the target thickness effect is negligible.…”

Charge-state dependence ofM-shell x-ray production inHo67by 2–12-MeV carbon ions

“…These electron capture contributions were obtained by subtracting the M-shell x-ray production cross sections for q = 3+ or 4+ from those of q = 5 + and 6+ as mentioned earlier using Eqs. (3) and (4). This difference should give the contribution of electron capture into the hydrogenlike (q=5+) or bare (q=6+) carbon ions.…”

“…The first reported work on charge-state effects in x-ray yields for ion-atom collisions was made in 1972 by Macdonald et al [4].They showed that for 35.7-MeV fluorine ions, the x-ray yield in argon, krypton, and xenon was dependent on the incident charge state with the yields increasing as much as a factor of 5 for the higher charge states. This paper was followed by another from the same group [5], as well as from Mowat et al [6] and Brandt et al [7].The first theoretical paper to address these data was by Halpern and Law [8] in which they showed that the high Z dependence of the x-ray yield could be accounted for by including K-shell charge exchange into bound states of the fully stripped projectile.…”