2023
DOI: 10.1016/j.apsusc.2023.158052
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Dependence of WAL effect and enhancement of spin-orbit coupling effect in Bi1.2Sb0.8Te0.4Se2.6 low-temperature magnetic transport

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Cited by 2 publications
(3 citation statements)
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“…Therefore, the transport information measured represented the sum of the contributions from both the bulk and the surface. Particularly in thinner TI films where the bulk-surface coupling phenomenon was more salient, the test results primarily reflected the contribution of bulk transport, which was more pronounced as temperature increased …”
Section: Discussionmentioning
confidence: 95%
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“…Therefore, the transport information measured represented the sum of the contributions from both the bulk and the surface. Particularly in thinner TI films where the bulk-surface coupling phenomenon was more salient, the test results primarily reflected the contribution of bulk transport, which was more pronounced as temperature increased …”
Section: Discussionmentioning
confidence: 95%
“…Particularly in thinner TI films where the bulk-surface coupling phenomenon was more salient, the test results primarily reflected the contribution of bulk transport, which was more pronounced as temperature increased. 19 Current−Voltage (IV) Curve Tests. As illustrated in Figure 3b, we presented the current−voltage (I−V) curves for the four samples at room temperature, which showcased a gradually decreasing trend in their slopes.…”
Section: ■ Introductionmentioning
confidence: 99%
“…In topological insulators (TIs), the coupling effect between bulk and surface states, particularly pronounced in thinner TI films, often obscures the surface state information, to some extent, by the bulk state features. In PPMS testing, due to the use of contact electrodes, this measurement method inevitably leads to current passing through both the interior and surface of the sample [ 20 ]. Consequently, the obtained electronic transport information represented a combined result of contributions from both bulk and surface, as depicted in Figure 3 a, which illustrates the dual-channel, bulk-surface transport principle in TI materials and the principle of PPMS measurement [ 21 ].…”
Section: Discussionmentioning
confidence: 99%