Dependence of the Structural and Magnetic Properties on the Growth Sequence in Heterostructures Designed by YbFeO3 and BaFe12O19

Bauer, Sondes; Nergis, Berkin; Jin, Xiaowei; Schneider, Reinhard; Wang, Di; Kübel, Christian; Machovec, Petr; Horak, Lukas; Holy, Vaclav; Seemann, Klaus; Baumbach, Tilo; Ulrich, Sven

doi:10.3390/nano14080711

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References 65 publications

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“…This permits us to draw conclusions about the enhancement of crystal quality of the epitaxial YbFO film as Th Pt increases and reaches the optimum Th Pt = 70 nm. We applied the Williamson–Hall (WH) approach [ 19 , 20 , 21 ] to the plots of Figure 5 a,b, where we assumed that the YbFO film is composed of mosaic blocks with a lateral size L H YbFO and vertical size L V YbFO , which were misaligned relative to the c-axis with a degree of misorientation α YbFO and vertically strained due to defect and grain boundary formation. From the intercept and the slope of the different FWHM rad plots vs. the reflection order in Figure 5 a, we derived the mean vertical size L V YbFO and mean values of the vertical strain distribution < β ⊥ YbFO > of the YbFO mosaic crystal blocks, as summarized in section § 5.…”

Section: Resultsmentioning

confidence: 99%

Relevance of Platinum Underlayer Crystal Quality for the Microstructure and Magnetic Properties of the Heterostructures YbFeO3/Pt/YSZ(111)

Bauer,

Nergis,

Jin

et al. 2024

Nanomaterials

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The hexagonal ferrite h-YbFeO3 grown on YSZ(111) by pulsed laser deposition is foreseen as a promising single multiferroic candidate where ferroelectricity and antiferromagnetism coexist for future applications at low temperatures. We studied in detail the microstructure as well as the temperature dependence of the magnetic properties of the devices by comparing the heterostructures grown directly on YSZ(111) (i.e., YbPt_Th0nm) with h-YbFeO3 films deposited on substrates buffered with platinum Pt/YSZ(111) and in dependence on the Pt underlayer film thickness (i.e., YbPt_Th10nm, YbPt_Th40nm, YbPt_Th55nm, and YbPt_Th70nm). The goal was to deeply understand the importance of the crystal quality and morphology of the Pt underlayer for the h-YbFeO3 layer crystal quality, surface morphology, and the resulting physical properties. We demonstrate the relevance of homogeneity, continuity, and hillock formation of the Pt layer for the h-YbFeO3 microstructure in terms of crystal structure, mosaicity, grain boundaries, and defect distribution. The findings of transmission electron microscopy and X-ray diffraction reciprocal space mapping characterization enable us to conclude that an optimum film thickness for the Pt bottom electrode is ThPt = 70 nm, which improves the crystal quality of h-YbFeO3 films grown on Pt-buffered YSZ(111) in comparison with h-YbFeO3 films grown on YSZ(111) (i.e., YbPt_Th0nm). The latter shows a disturbance in the crystal structure, in the up-and-down atomic arrangement of the ferroelectric domains, as well as in the Yb–Fe exchange interactions. Therefore, an enhancement in the remanent and in the total magnetization was obtained at low temperatures below 50 K for h-YbFeO3 films deposited on Pt-buffered substrates Pt/YSZ(111) when the Pt underlayer reached ThPt = 70 nm.

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Section: Resultsmentioning

confidence: 99%