2008
DOI: 10.1080/14786430801953142
|View full text |Cite
|
Sign up to set email alerts
|

Dependence of the optical properties of UHV deposited silver thin films on the deposition parameters and their relation to the nanostructure of the films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2009
2009
2021
2021

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 11 publications
(3 citation statements)
references
References 40 publications
0
3
0
Order By: Relevance
“…It is well known that the permittivity of Ag is dependent upon the deposition conditions; 16,31,32 thus, it is necessary to characterize each film individually. The frequency dependence of the permittivity in the visible region of the spectrum can generally be described by the Drude model…”
Section: A Linear Characterizationmentioning
confidence: 99%
“…It is well known that the permittivity of Ag is dependent upon the deposition conditions; 16,31,32 thus, it is necessary to characterize each film individually. The frequency dependence of the permittivity in the visible region of the spectrum can generally be described by the Drude model…”
Section: A Linear Characterizationmentioning
confidence: 99%
“…[ 10 ] A significant number of scientists have determined the VIS–NIR optical constants of graphene, [ 11–15 ] but the results strongly depend on the deposition and growth method, purity, oxidation, transfer, and interactions with the substrate. [ 16,17 ]…”
Section: Introductionmentioning
confidence: 99%
“…[26] In their work, contour plots of the reflectance and transmittance were used to determine the complex index of refractionñ(ω) = n(ω) + ik(ω). [29,47] Large inconsistencies between the different measurements exist and were noted early, and suggested to be due to sample contamination [48,49], differences in surface morphologies [50,51], strain [44,52], and the different measurement techniques. [16] Some data even appear unphysical with noted anomalies such as a broad peak in the reflectance spectrum at 5 µm.…”
Section: Past Measurements Of Dielectric Functionmentioning
confidence: 99%