2014
DOI: 10.1016/j.pss.2013.07.008
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Dependence of lunar surface charging on solar wind plasma conditions and solar irradiation

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Cited by 97 publications
(49 citation statements)
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References 61 publications
(92 reference statements)
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“…This may have been due to the fact that the observations on orbit 164 were over the lunar North Pole, rather than viewing closer to the lunar equator as occurred on orbit 66 and 273. However, this is not anticipated to be a significant factor for lunar surface charging and electrostatic lofting, which are primarily dependent on solar zenith angle [ Stubbs et al ., , ]. Therefore, consistent with the reanalysis of the Apollo coronal photography by Glenar et al .…”
Section: Discussionsupporting
confidence: 89%
“…This may have been due to the fact that the observations on orbit 164 were over the lunar North Pole, rather than viewing closer to the lunar equator as occurred on orbit 66 and 273. However, this is not anticipated to be a significant factor for lunar surface charging and electrostatic lofting, which are primarily dependent on solar zenith angle [ Stubbs et al ., , ]. Therefore, consistent with the reanalysis of the Apollo coronal photography by Glenar et al .…”
Section: Discussionsupporting
confidence: 89%
“…Surface charging at Earth's Moon has been extensively investigated through spacecraft observations [ Halekas et al ., , , , , , ] and through theoretical studies [ Manka , ; Farrell et al ., ; Stubbs et al ., , ; Poppe and Horányi , ; Poppe et al ., ]. These studies have generally found that the dayside lunar surface is charged a few volts positive (~10 V) and that the lunar nightside and terminator regions reach strongly negative potentials (~ −100 to −200 V).…”
Section: Discussionmentioning
confidence: 99%
“…We also assume the charge deposition layer to be infinitely planar [cf. Stubbs et al , ]. This is reasonable because the particle deposition occurs over regions whose length scales L are very large relative to the penetration depths (i.e., z ≪ L ).…”
Section: Double Charge Layer Modelmentioning
confidence: 99%