1983
DOI: 10.1016/0038-1101(83)90114-4
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Dependence of electronic properties of polysilicon grain size and intragrain defects

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Cited by 54 publications
(5 citation statements)
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“…As for the influence of grain boundaries (GB), while it is known that minority carrier properties depend on the grain size up to 1 mm (7,8), it has been also suggested that the electrical effects of GB could depend on the type of boundary and on its interaction with dislocations and impurities (7). This does not necessarily mean, as has been strongly felt in the past, that in polycrystalline materials the purity requirements are somewhat relaxed with respect to a single crystal material but that the impurities behave, in polycrystalline samples in a rather different fashion than in single crystal material.…”
mentioning
confidence: 99%
“…As for the influence of grain boundaries (GB), while it is known that minority carrier properties depend on the grain size up to 1 mm (7,8), it has been also suggested that the electrical effects of GB could depend on the type of boundary and on its interaction with dislocations and impurities (7). This does not necessarily mean, as has been strongly felt in the past, that in polycrystalline materials the purity requirements are somewhat relaxed with respect to a single crystal material but that the impurities behave, in polycrystalline samples in a rather different fashion than in single crystal material.…”
mentioning
confidence: 99%
“…Such i. s not the case, however, for the majority carrier. And there is also experimental evidence that the ratio of these two mobilities is nearly constant in both single-and poly-crystal silicon [15]. Thus, the minority carrier mobility p. may be expressed as…”
Section: -4mentioning
confidence: 99%
“…where r is about 2.5 [15], and P. err is effective mobility. For doped materials, P. err is very close to the majority carrier mobility in polysilicon and can be represented by [13] 1…”
Section: -4mentioning
confidence: 99%
“…The purpose of the present section is to determine to what extent the EMC model can be used in order to calculate the photovoltaic properties from the measurement of an effective diffusion length Leff in polycrystalline silicon [3,5] by means of the Surface PhotoVoltage (SPV) method [24]. This forecast is very important since this measurement is relatively easy and does not need the full realization of a solar cell which is arduous and expensive.…”
Section: Base Doping Concentration Influence -mentioning
confidence: 99%
“…Polycrystalline silicon is different from monocrystalline silicon essentially due to the presence of grain boundaries (gb) which act as recombination centres for excess carriers [1,2] and which contribute to a marked decrease of solar cell efficiencies [3][4][5][6]. The gb recombination of the excess carriers takes place via the gb interface states which can be due to the dangling bonds, the dislocations, or the impurities segregated or diffused into the grain boundaries.…”
mentioning
confidence: 99%