2006
DOI: 10.1063/1.2423232
|View full text |Cite
|
Sign up to set email alerts
|

Dependence of carrier localization in InGaN∕GaN multiple-quantum wells on well thickness

Abstract: Carrier localization in InGaN∕GaN multiple-quantum wells (MQWs) with three different well thicknesses was investigated optically using time-integrated and time-resolved microphotoluminescence spectroscopy. An anomalous temperature dependence of the photoluminescence peak energy was observed, as a consequence of local potential fluctuations. The carrier localization was more prominent in the case of MQWs with wide well thickness. The results indicate that the degree of potential fluctuation increases with incre… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
34
0

Year Published

2012
2012
2020
2020

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 35 publications
(34 citation statements)
references
References 20 publications
0
34
0
Order By: Relevance
“…3. It is worth noting that the localized character of PL is expected at low temperatures for this material system even for high quality QWs [40][41][42]. The importance of non-radiative recombination is difficult to discuss in this case since the mechanism of non-radiative recombination is suppressed at low temperatures, i.e., τ nr τ r .…”
Section: Resultsmentioning
confidence: 99%
“…3. It is worth noting that the localized character of PL is expected at low temperatures for this material system even for high quality QWs [40][41][42]. The importance of non-radiative recombination is difficult to discuss in this case since the mechanism of non-radiative recombination is suppressed at low temperatures, i.e., τ nr τ r .…”
Section: Resultsmentioning
confidence: 99%
“…This has also been observed on InGaN/GaN MQWs grown on free-standing GaN substrates. [9][10][11][12][13] A standard two exponential component model is used to study excitonic dynamics, and thus TRPL traces [I(t)] can be described by [16][17][18] IðtÞ ¼ A 1 expðÀt=s 1 Þ þ A 2 expðÀt=s 2 Þ:…”
mentioning
confidence: 99%
“…The biexponential fit comprises a fast decay component s 1 describing delocalized exciton recombination and a slow decay component s 2 describing communication between localized states [24]. At room temperature, the two samples show I 1 (0) ) I 2 (0), indicating that s 1 can be taken as the representative decay lifetime s PL .…”
Section: Resultsmentioning
confidence: 99%
“…4, the decay traces of TRPL spectra show nonsingle exponential forms, and a standard two exponential component model is used to study excitonic dynamics. And thus the TRPL traces can be fitted by the following exponential decay expression [23,24]:…”
Section: Resultsmentioning
confidence: 99%