Density of states and current-voltage characteristics in SIsFS junctions
S. V. Bakurskiy,
A. A. Neilo,
N. V. Klenov
et al.
Abstract:We study the density of states (DOS) inside superconducting Josephson SIsFS junctions with complex interlayer consisting of a thin superconducting spacer 's' between insulator I and a ferromagnetic metal F. The consideration is focused on the local density of states in the vicinity of a tunnel barrier, and it permits to estimate the current-voltage characteristics in the resistive state of such junctions. We study the influence of the proximity effect and Zeeman splitting on the properties of the system, and w… Show more
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