Density Measurements of Some Thin Copper Films

Wainfan, N.; Scott, Nancy J.; Parratt, Lyman G.

doi:10.1063/1.1735008

Cited by 61 publications

(14 citation statements)

References 6 publications

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“…Weighed amounts of the metals, in the form of 7-to 15-mil wire at least 99.95% pure, were evaporated from heated tungsten filaments to give a film thickness of 100 Α., by assuming the density of the film to be the same as that of bulk metal [12,19].…”

Section: Methodsmentioning

confidence: 99%

Direct Measurement of Adsorption of Radiostearic Acid onto Vapor-Deposited Metal Films

Walker¹,

Ries²

1964

Advances in Chemistry

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Radiostearic acid was adsorbed from n-hexadecane onto mica and thin vapor-deposited films of iron, gold, and copper that had been exposed to dry and water-saturated helium or air. Adsorption was measured directly and continuously by a recently developed technique. The mica substrate showed essentially zero adsorption. None of the metals adsorbed more than one stable compact monolayer. Iron and gold showed a large difference in adsorption in dry helium or air, but adsorbed about the same amount, 0.2 to 0.5 monolayer, when exposed to either wet helium or air. Copper adsorbed 0.3 to 0.7 monolayer in all atmospheres except wet air, in which it showed a weak adsorption of nine monolayers; rinsing with hexane removed all but one monolayer.In most techniques for studying adsorption on metals, uniform, clean, and reproducible metal surfaces are difficult to prepare and the adsorption process cannot be followed continuously [2, 3,4, 7,10,11,16, 18, 21], Clean and reproducible metal surfaces are also difficult to prepare and maintain in methods that measure adsorption continuously and directly on a metal-coated window of a Geiger tube [l, 6,7,13]. A recently developed apparatus and technique provide controlled conditions for the production and maintenance of relatively clean metal films and the precise measurement of adsorption [20]. Metal is evaporated onto a mica window supported within a high-vacuum apparatus; adsorption onto the metal film is measured directly and continuously by a counter tube below the window.Reported previously were results of the adsorption of radiostearic acid from dilute n-hexadecane solution onto the mica substrate and 295 Downloaded by UNIV OF MICHIGAN ANN ARBOR on February 18, 2015 |

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Section: Methodsmentioning

confidence: 99%

Direct Measurement of Adsorption of Radiostearic Acid onto Vapor-Deposited Metal Films

Walker¹,

Ries²

1964

Advances in Chemistry

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“…In Parratt ' s studies [4] , the theory was set out on how to apply the technique to multilayer samples in order to extract an electron density profi le of the surface region. In 1959, X -ray refl ectometry was used to determine the density of copper fi lms [21] , and in 1960 the annealing and oxidation of evaporated fi lms of Cu, Ni, Ge, and Se was studied [22] . However, the technique remained relatively obscure until further investigations were conducted during the 1970s [15,16] , whereby surface and interfacial roughness could be taken into account in the analysis procedures.…”

Section: Grazing Incidence X -Ray Refl Ectivity ( Gxrr )mentioning

confidence: 99%

Grazing Incidence X‐Ray Methods for Near‐Surface Structural Studies

Gibson

2011

Surface and Thin Film Analysis

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PrinciplesX -ray diffraction ( XRD ) represents the classical method for determining the crystalline structure of solid materials. The basic principle of XRD -Bragg ' s law -was expounded early during the twentieth century, and subsequently supplemented by theories regarding the detailed interpretation of XRD patterns. Over the past several decades, the instrumentation of XRD has evolved continuously, with more powerful and collimated X -ray beams and different diffraction geometries opening up possibilities for structural analysis in many different applications. Today, sophisticated software packages facilitate studies into determining the structure of very complex crystallographic systems. As research into surface modifi cation has led to increasing numbers of applications in industry -especially of thin fi lms -" grazing incidence, " or " glancing angle " geometries have been developed in order to render XRD more surface -sensitive. Currently, many XRD equipment manufacturers offer systems, or system attachments for " glancing angle " or " grazing incidence " XRD (GAXRD, GIXRD, GIXD, or GXRD). The aim of this chapter is to provide a broad outline of the two major grazing incidence XRD geometries, and to identify the differences between these and the standard θ − 2 θ diffraction method. The technique of grazing incidence X -ray refl ectivity ( GXRR , GIXR, GXR, or XRR) is also described, as the related theory is of central relevance here and is often applied on the same systems used for GAXRD. In order to complete the picture concerning grazing incidence X -ray structural analysis, a particular variant of X -ray absorption spectroscopy is briefl y mentioned. However, this technique can only be effectively applied at synchrotron radiation sources, and a full description of the method and the enormous range of applications would require a lengthy article in itself. In this chapter GXRR and one of the two principal glancing angle diffraction techniques are described in more detail, as these are normally applied on laboratory X -ray systems. Since theoretical aspects are not

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“…Quantitative estimation of the thickness of the layer in which lead ions are distributed can be obtained by fitting model calculations to the Pb fluorescence data. For calculating the reflectivity and the intensity of the fluorescence yield from protein/lipid film the recursive method developed by Parratt (Wainfan et al, 1959) has been used. The best fit of the Pb fluorescence data corresponds to a thickness of the Pb layer of 13 nm for sample 1 and 1 nm for sample 2.…”

Section: Samples 1 Andmentioning

confidence: 99%

X-ray fluorescence methods for investigations of lipid/protein membrane models

Новикова

Yurieva²,

Zheludeva

et al. 2005

J Synchrotron Radiat

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The protective effect of the bisphosphonate drug xydiphone (K,Na-ethidronate) on membrane-bound enzyme damaged by lead ions has been studied. A protein/lipid film of Ca-ATPase/phosphatedylethanolamine deposited on a silicon substrate was used as a model system. The position of lead ions within the molecular film before and after the xydiphone treatment was determined using the total-reflection X-ray fluorescence method. This technique is based on the simultaneous measurement of the X-ray reflection and the yield of the fluorescence radiation excited by X-ray inelastic scattering. The possibility of directly locating lead ions is the main advantage of this approach. Xydiphone has been found to effectively eliminate lead ions that have been incorporated into Ca-ATPase molecules during a preliminary incubation in lead acetate solution. The lead ions that were bound at the sites of the Ca-ATPase attachment to the phospholipid monolayer have proved to be inaccessible for xydiphone. A preliminary incubation of Ca-ATPase in the xydiphone solution precluded the incorporation of lead ions into the protein.

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Density Measurements of Some Thin Copper Films

Cited by 61 publications

References 6 publications

Direct Measurement of Adsorption of Radiostearic Acid onto Vapor-Deposited Metal Films

Direct Measurement of Adsorption of Radiostearic Acid onto Vapor-Deposited Metal Films

Grazing Incidence X‐Ray Methods for Near‐Surface Structural Studies

X-ray fluorescence methods for investigations of lipid/protein membrane models

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