2014
DOI: 10.1016/j.carbon.2013.11.014
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Density control of carbon nanowalls grown by CH4/H2 plasma and their electrical properties

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Cited by 70 publications
(66 citation statements)
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“…The peaks at 286.5 and 288.7 eV were assigned to C-O and O-C=O, respectively. These binding energies are in agreement with those reported in literature [9,12,24]. A similar procedure was utilized to decompose O 1s into two components such as C-OH and C-O bonds as revealed in Figure 4(d).…”
Section: Formation Of Hierarchical 2d-cnwsupporting
confidence: 78%
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“…The peaks at 286.5 and 288.7 eV were assigned to C-O and O-C=O, respectively. These binding energies are in agreement with those reported in literature [9,12,24]. A similar procedure was utilized to decompose O 1s into two components such as C-OH and C-O bonds as revealed in Figure 4(d).…”
Section: Formation Of Hierarchical 2d-cnwsupporting
confidence: 78%
“…The D / G value varies in range of 1.7 to 2.7 which is close to the D / G value of 2D-CNW features previously reported in the literature [9,19,20]. This may be due to the enhancement in atomic arrangement as a result of the removal of weak C-C bonds which contribute to the disorder in the film structure.…”
Section: Formation Of Hierarchical 2d-cnwsupporting
confidence: 59%
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“…Since then, several groups have explored the growth of VGNs on catalytic as well as non-catalytic metal / dielectric surfaces using various plasma based techniques such as microwave PECVD, dc plasma discharge, ICP-plasma and thermal plasma jet systems. [10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26][27] In an excellent review, Bo et al 11 summarized the influence of various key process parameters on the synthesis and growth model for NGSs on various types of substrates. In spite of several existing reports, herein we note that, still there is no unique theory that could unveil the atomistic growth mechanism and give a prescription to optimize the process parameters for a given plasma source.…”
Section: Introductionmentioning
confidence: 99%