1998
DOI: 10.1063/1.475730
|View full text |Cite
|
Sign up to set email alerts
|

Density and index of refraction of water ice films vapor deposited at low temperatures

Abstract: The density of 0.5-3 m thick vapor-deposited films of water ice were measured by combined optical interferometry and microbalance techniques during deposition on an optically flat gold substrate from a capillary array gas source. The films were of high optical quality with an index of refraction of 1.29Ϯ0.01 at 435.8 nm, a density of 0.82Ϯ0.01 g/cm 3 , and a porosity of 0.13Ϯ0.01. In contrast to previous studies, none of the measured properties exhibited any significant variation with growth rate or temperatur… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

6
140
0

Year Published

2000
2000
2016
2016

Publication Types

Select...
4
3
1

Relationship

0
8

Authors

Journals

citations
Cited by 178 publications
(149 citation statements)
references
References 55 publications
(75 reference statements)
6
140
0
Order By: Relevance
“…This amplitude change can have different reasons; a loss of coherence of the reflected light because of surface roughness, cracks, and/or wide boundaries (Baragiola 2003;Howett et al 2007;Romanescu et al 2010). The distance A82, page 2 of 5 between subsequent minima and maxima is constant within 1% indicating that the density of the porous ASW does not change significantly during deposition (Westley et al 1998).…”
Section: Experimental Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…This amplitude change can have different reasons; a loss of coherence of the reflected light because of surface roughness, cracks, and/or wide boundaries (Baragiola 2003;Howett et al 2007;Romanescu et al 2010). The distance A82, page 2 of 5 between subsequent minima and maxima is constant within 1% indicating that the density of the porous ASW does not change significantly during deposition (Westley et al 1998).…”
Section: Experimental Methodsmentioning
confidence: 99%
“…For layered structures (Fig. 6), the reflection coefficient R can be written as a function of the Fresnel reflection coefficients according to the relation (Westley et al 1998;Dohnalek et al 2003):…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Water-ice morphology/structure strongly depends on deposition conditions such as temperature, deposition rate, and growth angle (e.g., Hagen et al 1983;Jenniskens & Blake 1994;Westley et al 1998;Kimmel et al 2001a,b;Dohnálek et al 2003).…”
Section: Resultsmentioning
confidence: 99%
“…for crystalline H 2 O-ice (Hale and Querry, 1973), 1.29 for amorphous H 2 O-ice (Westley et al, 1998;Dohnálek et al, 2003)], and h ice is the angle of reflection in the ice (taken to be 45°). After the ice was fully deposited, its spectrum was obtained and ratioed to the background spectrum.…”
Section: Methodsmentioning
confidence: 99%