A table-top near-edge
X-ray absorption fine structure (NEXAFS)
spectroscopy system consisting of a soft X-ray source and an integrated
spectrometer with a significantly improved resolution is presented.
The soft X-ray source is based on a long-term stable and nearly debris-free
picosecond laser-induced plasma generated in a pulsed krypton gas
jet target. Photon energies ranging from 250 to 1000 eV can be used
for the absorption spectroscopy of thin samples. The newly designed
spectrometer accomplishes a spectral resolution of E/ΔE = 1535 at 430 eV, being close to typical
synchrotron setups. Moreover, a simultaneous multi-edge analysis is
possible. The performance of the new system is demonstrated by investigating
the fine structure of the K- and L-absorption edges of various elements
(carbon, calcium, oxygen, iron, nickel, and copper) for different
types of samples. An excellent agreement with synchrotron spectra
is achieved.