Delay modeling of high-speed distributed interconnect for the signal integrity prediction

Raveloa, B.

doi:10.1051/epjap/2012110374

Cited by 31 publications

(21 citation statements)

References 41 publications

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“…The electrical equivalent circuit of the atom probe excitation system understudy is mainly composed of TL driven by a voltage source herein denoted v in with internal impedance Z s ended by output load impedance Z L as proposed in [2,3]. The input and output currents delivered by the source and propagating across the load are denoted as i in and i out , respectively.…”

Section: Behavioral Model Of the E-pulser Systemmentioning

confidence: 99%

“…Due to the interconnect lines unmatching, several electromagnetic (EM) and electrical phenomena need to be predicted during the characterization of high speed signals as electrical fast transient (EFT) and surge voltages/currents behaviors. Owing to such an effect, various numerical and analytical modelling methods of interconnect lines for high speed signal sharing were developed [3][4][5][6]. Those easy and fast computational methods are subsequently integrated by electronic design engineers in their circuit models in order to predict the signal integrity (SI) especially when the operating frequency is higher [2][3][4][5][6].…”

Section: Introductionmentioning

confidence: 99%

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Analysis of Excitation Pulsed Signal Propagation for Atom Probe Tomography System

Ravelo¹,

Vurpillot²

2014

PIER Letters

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Abstract-The purpose of this paper is on the behavioral modelling of surge voltage pulses used in Atom Probe Tomography. After brief description of the atom probe functioning principle, we examine the excitation electrical pulse signal integrity along the electric pulser (E-pulser) feeding line modelling with respect to the IEC1733/04 standard. This feeding electric line is ended by cylindrical via ground to control the ion emission. By using the transmission line (TL) ultra-broadband RLCG model, the propagating pulsed signals degradation is predicted. The signal propagation was analysed in both frequency and time domains by taking into account the substrate dispersion. The wideband frequency behaviours of the surge signal along the feeding line were examined from DC-to-2 GHz. In addition, by considering pulse surge signals with pulse-width and rise-/fall-time parameters (T 1 = 9 ns, t r1 = t f 1 = 1.6 ns) and (T 2 = 30 ns, t r2 = 4 ns/t f 2 = 18 ns), the transient responses from 5 cm-to-20 cm length TL are characterized. It was shown that the excitation pulse was significantly distorted. It was emphasized that the operated signal delay varies from 0.3 ns-to-1.5 ns in function of the via capacitor value. The time-dependent radiated E-field on the performance of the atom probe system which enables to characterize the nature of tested materials (ions or atoms) is discussed. The presented analysis approach is particularly useful for E-pulser integrated in measurement scientific instruments as Atom Probe Tomography time of flight optimisation, a nano-analysing technique that uses ultra-sharp high vacuum pulse to induce controlled erosion of samples. In this application, the excitation voltage pulse integrity during the propagation is required in order to improve the measurement instrument performances.

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Section: Behavioral Model Of the E-pulser Systemmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Analysis of Excitation Pulsed Signal Propagation for Atom Probe Tomography System

Ravelo¹,

Vurpillot²

2014

PIER Letters

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“…The neutralization technique proposed in [57] is interesting for reducing the degradation caused the electrical interconnections in the printed circuit board (PCB) and microelectronic systems instead of the technique based on the use of repeaters [58]. With the increase of the operating data speed, the microelectronic signals propagating through the PCB interconnections and wireless propagation channels are victim of undesired degradations [59][60][61][62][63][64]. In circuit approach, this later can be usually modelled by RC-, LCand RLC-networks.…”

Section: Introductionmentioning

confidence: 99%

Neutralization of LC- and RC-Disturbances with Left-Handed and NGD Effects

Ravelo

2013

AEM

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This paper focus is on the neutralization technique of the unwanted parasitic effects on radio frequencies (RF) and digital electronic circuits. Most of parasitic effects induced in these circuits can be modeled by RC-and LC-networks. For canceling these disturbing effects, we can proceed with operation as transfer function neutralization in the considered operating frequency bands. The neutralization presented in this paper is developed by using first, a lefthanded (LH) and negative group delay (NGD) circuits inspired from metamaterials. The theoretical approach illustrating the RC-and LC-effects neutralization is described. Synthesis relations enabling to determine the elements of required LH and NGD circuit correctors in function of the perturbation parameters are established. Numerical and experimental demonstrators are presented to validate the technique proposed.

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“…Due to the unceasing increase of the electronic system integration, the modern high-speed electronic equipment meets different technological roadblocks due to the interconnect complexity [10][11][12][13][14][15]. In addition to the investigation on the apparition of electromagnetic interferences (EMI) and electromagnetic compatibility (EMC), many works stating the power loss and the interconnect delay effects for example, in the RF/digital devices were done [6,[16][17][18][19][20][21][22][23]. Because of the undesired interconnection perturbations, it has been evidenced that the interconnect delays of high speed digital IC dominate widely gate delays [5].…”

Section: Introductionmentioning

confidence: 99%

“…During the data stream transmission, these technological issues can be sources of signal distortions, asynchronous effects of the transmitted analog signals and erroneous symbols. So, intensive researches were performed on the modeling of the interconnect networks in order to predict the signal integrity (SI) [9,[11][12][13][14][15][17][18][19][20][21][22][23][24]. To minimize the cost and energy consumption and also for sharing data and clock signals through multipath circuits can be composed of ICs packaged in different levels this later is fundamental [25][26][27][28].…”

Section: Introductionmentioning

confidence: 99%

Behavioral Model of Symmetrical Multi-Level T-Tree Interconnects

Ravelo¹

2012

PIER B

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Abstract-An accurate and behavioral modeling method of symmetrical T-tree interconnect network is successfully investigated in this paper. The T-tree network topology understudy is consisted of elementary lumped L-cells formed by series impedance and parallel admittance. It is demonstrated how the input-output signal paths of this single input multiple output (SIMO) tree network can be reduced to single input single output (SISO) network composed of L-cells in cascade. The literal expressions of the currents, the input impedances and the voltage transfer function of the T-tree electrical interconnect via elementary transfer matrix products are determined. Thus, the exact expression of the multi-level behavioral T-tree transfer function is established. The routine algorithm developed was implemented in Matlab programs. As application of the developed modeling method, the analysis of T-tree topology comprised of different and identical RLC-cells is conducted. To demonstrate the relevance of the model established, lumped RLC T-tree networks with different levels for the microelectronic interconnect application are designed and simulated. The work flow illustrating the guideline for the application of the routine algorithm summarizing the modeling method is proposed. Then, 3D-microstrip T-tree interconnects with width 0.1 µm and length 3 mm printed on FR4-substrate were considered. As results, a very good agreement between the results from the reduced behavioral model proposed and SPICE-computations is found both in frequency-and timedomains by considering arbitrary binary sequence "01001100" with 2 Gsym/s rate. The model proposed in this paper presents significant benefits in terms of flexibility and very less computation times. It can be used during the design process of the PCB and the microelectronic circuits for the signal integrity prediction. In the continuation of this 24Ravelo work, the modeling of clock T-tree interconnects for packaging systems composed of distributed elements using an analogue process is in progress.

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Delay modeling of high-speed distributed interconnect for the signal integrity prediction

Cited by 31 publications

References 41 publications

Analysis of Excitation Pulsed Signal Propagation for Atom Probe Tomography System

Analysis of Excitation Pulsed Signal Propagation for Atom Probe Tomography System

Neutralization of LC- and RC-Disturbances with Left-Handed and NGD Effects

Behavioral Model of Symmetrical Multi-Level T-Tree Interconnects

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