1976
DOI: 10.1051/jphyscol:1976446
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DEGREE OF VALENCE MIXING IN THE METALLIC PHASE OF SmS AND IN TmSe

Abstract: Rksumk.-Nous avons mesurk la rkflectivite optique du TmSe et de la phase metallique du SmS avec des photons d'knergie entre 0,03 eV et 12 eV. Par les mesures diffkrentielles des constantes de rkseau du SmS semi-conducteur et metallique et de la frequence des plasmons, nous concluons a une valence intermediaire (2,85-2,9) dans la phase & haute pression. Dans le TmSe, la frkquence des plasmons revkle ? i peu prks un electron delocalid par ion de Tm.

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“…It seems that the strongly correlated character [37] and the volatile nature of the Sm oxidation state in the compound prevents a detailed analysis of the SmS stoichiometry and switching characteristics using conventional XPS. In-situ pressure dependent XPS analysis would be needed to shed light on the Sm valence state behavior, not only during the applied pressure but also upon pressure release.…”
Section: Resultsmentioning
confidence: 99%
“…It seems that the strongly correlated character [37] and the volatile nature of the Sm oxidation state in the compound prevents a detailed analysis of the SmS stoichiometry and switching characteristics using conventional XPS. In-situ pressure dependent XPS analysis would be needed to shed light on the Sm valence state behavior, not only during the applied pressure but also upon pressure release.…”
Section: Resultsmentioning
confidence: 99%