Degradation of the Conducted Radio Frequency Immunity of Microcontrollers Due to Electromagnetic Resonances in Foot-Point Loops

Su, Tao; Unger, Markus; Steinecke, T.; Weigel, Robert

doi:10.1109/temc.2011.2178098

Cited by 5 publications

(4 citation statements)

References 28 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Otherwise, the cell is considered in failed status. More information about the immunity simulation setup and its background can be found in (4). The simulated maximal tolerable amplitudes of the AC voltage at various frequencies (of the AC, meaning the EMI frequency) are shown in the Figure 5c.…”

Section: Simulation Resultsmentioning

confidence: 99%

An On-Chip EMI Sensor Array

Huang

Wang

2013

ECS Trans.

View full text Add to dashboard Cite

show abstract

Section: Simulation Resultsmentioning

confidence: 99%

An On-Chip EMI Sensor Array

Huang

Wang

2013

ECS Trans.

View full text Add to dashboard Cite

show abstract

“…The EC of the onchip component is extracted through the combination of impedance measurement and field simulation. A more detailed description of the model construction can be found in [7]. The simulator is HSPICE.…”

Section: Simulationsmentioning

confidence: 99%

“…When a RFI signal is applied to an IC, the signal goes through the disturbance propagation network (DPN) and arrives at the on-chip transistor circuit (OCTC). Previous researches [2][3][4][5][6][7] in immunity modeling of modern ICs have focused on constructing the model of DPN and use the frequency behaviour of DPN to reproduce the frequency behaviour of the RF immunity. However, besides DPN, the response of OCTC to the arrived RFI may vary with f RFI .…”

Section: Introductionmentioning

confidence: 99%

The Frequency Behaviour of the Intrinsic Immunity of the on-Chip Transistor Circuit

Su¹,

Zheng²,

Yang³

et al. 2014

PIER Letters

Self Cite

View full text Add to dashboard Cite

To extract the immunity model in an easy way and to complete the immunity simulation in a short time, it is preferred to consider only the disturbance propagation network in an integrated circuit system. However, through theoretical analyses, simulations and measurements, this paper shows that the on-chip transistor circuit has a nonuniform frequency response on its immunity against arrival disturbances. Including the nonuniform frequency response qualitatively improves the match between the simulation and measurement results. The conclusion is that both the disturbance propagation network and on-chip transistor circuit should be considered in the immunity simulation.

show abstract

“…Normally, C XGBBI and C XGBBO share the same value. They are called the longitude foot-point capacitance [21]. C XXBBIO is called the transverse foot-point capacitance.…”

Section: Ion Modelsmentioning

confidence: 99%

Critical Model Components and Their Fingerprint Features in the Simulated Conducted Radio Frequency Immunity of Complex Integrated Circuits

Su¹,

Yang²,

Wang³

2013

PIER

Self Cite

View full text Add to dashboard Cite

Abstract-To analyze and to handle the radio frequency immunity of microcontrollers requires understanding the origins of the complex frequency response of the immunity. This paper assumes that the frequency response of the immunity can be characterized with a set of fingerprint features in the immunity curves. Positions and shapes of those fingerprint features are determined by certain components in the disturbance propagation network. In order to prove that assumption, a series of models are created and simulated. The roles of various model components on the immunity are analyzed by comparing the simulation results from different model structures. The fingerprint features on the immunity curves are identified. The paper shows how to treat a wide-range immunity curve with separated features. It also shows the responsible model components for those separated features. With the awareness of those features and their origins, researchers can concentrate on extracting the models of the most important components in the disturbance propagation network when modeling the immunity of the complex integrated circuits like microcontrollers.

show abstract

Degradation of the Conducted Radio Frequency Immunity of Microcontrollers Due to Electromagnetic Resonances in Foot-Point Loops

Cited by 5 publications

References 28 publications

An On-Chip EMI Sensor Array

An On-Chip EMI Sensor Array

The Frequency Behaviour of the Intrinsic Immunity of the on-Chip Transistor Circuit

Critical Model Components and Their Fingerprint Features in the Simulated Conducted Radio Frequency Immunity of Complex Integrated Circuits

Contact Info

Product

Resources

About