2016 Annual Reliability and Maintainability Symposium (RAMS) 2016
DOI: 10.1109/rams.2016.7447969
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Degradation of leakage currents and reliability prediction for tantalum capacitors

Abstract: Two types of failures in solid tantalum capacitors, catastrophic and parametric, and their mechanisms are described. Analysis of voltage and temperature reliability acceleration factors reported in literature shows a wide spread of results and requires more investigation.In this work, leakage currents in two types of chip tantalum capacitors were monitored during highly accelerated life testing (HALT) at different temperatures and voltages.Distributions of degradation rates were approximated using a general lo… Show more

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Cited by 3 publications
(3 citation statements)
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“…After this traumatic BD event, the insulator becomes metallic with linear STS spectra. This form of dielectric BD is typical for crystalline insulators (>10s of nm thick) in capacitors . In the ultrathin regime of 1–2 nm, hard BD is primarily observed by STS for epitaxial Al 2 O 3 .…”
Section: Resultsmentioning
confidence: 81%
See 1 more Smart Citation
“…After this traumatic BD event, the insulator becomes metallic with linear STS spectra. This form of dielectric BD is typical for crystalline insulators (>10s of nm thick) in capacitors . In the ultrathin regime of 1–2 nm, hard BD is primarily observed by STS for epitaxial Al 2 O 3 .…”
Section: Resultsmentioning
confidence: 81%
“…This form of dielectric BD is typical for crystalline insulators (>10s of nm thick) in capacitors. 40 In the ultrathin regime of 1−2 nm, hard BD is primarily observed by STS for epitaxial Al 2 O 3 . 36 Rather than gradual defect migration within the barrier, hard BD represents the breaking of the Al 2 O 3 bonds in the insulator.…”
Section: Acs Applied Materials and Interfacesmentioning
confidence: 99%
“…The tantalum capacitor is widely used in many fields, such as military, aerospace, and medical fields [1][2][3]. The performance of the tantalum capacitor directly influences the safe running of the system.…”
Section: Introductionmentioning
confidence: 99%