2010
DOI: 10.1016/j.jhazmat.2010.06.021
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Degradation of gaseous dioxin-like compounds with dielectric barrier discharges

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Cited by 23 publications
(9 citation statements)
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“…The hydroxycyclohexadienyl-type radical that is formed by adding the OH group to an aromatic benzene ring could be oxidized further by ubiquitous O 2 in atmosphere. 30 It is supported by the latest experimental study 31 on decomposition via OH radicals of PCDD/Fs . The destruction efficiency of PCDD/Fs increases significantly in the presence of oxygen and water vapor.…”
Section: Resultsmentioning
confidence: 89%
“…The hydroxycyclohexadienyl-type radical that is formed by adding the OH group to an aromatic benzene ring could be oxidized further by ubiquitous O 2 in atmosphere. 30 It is supported by the latest experimental study 31 on decomposition via OH radicals of PCDD/Fs . The destruction efficiency of PCDD/Fs increases significantly in the presence of oxygen and water vapor.…”
Section: Resultsmentioning
confidence: 89%
“…The P1 and P3 generated in Route (I), Route (III), Route (IV) and Route (V) can continue to react with O( 3 P) in the subsequent reactions, and the reaction mechanism is similar to the above reactions. 2,3,7,8-TCDD was detected in DBD reactor by Hung in their degradation experiment of OCDD (Hung et al, 2010). Thus, in the following, we will take P1 as an example to discuss the generation process of 1,4,6,9-tetraoxygen-2,3,7,8-TCDD.…”
Section: Reaction Of Ocdd With Atomic Oxygen O( 3 P)mentioning
confidence: 99%
“…Dielectric barrier discharges are used on a large industrial scale (Kogelschatz, 2003), and in recent years, they are used more and more for the degradation of pollutants (Snyder and Anderson, 1998;Takaki et al, 1999;He et al, 2005;Hung et al, 2010). In 2010, Hung found that the gaseous dioxin-like compounds can be degradated effectively in DBD reactor (Hung et al, 2010).…”
Section: Introductionmentioning
confidence: 99%
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“…The destruction process proceeded via UV, electrons and OH radicals generated by the DBC plasma process. All these destruction pathways significantly promoted destruction of PCDD/Fs Hung et al (2010) PCBs Supercritical water oxidation using hydrogen peroxide…”
Section: Electron Beam Technologymentioning
confidence: 99%