Degradation mechanisms of perovskite light-emitting diodes under electrical bias

Abstract

Metal-halide perovskite light-emitting diodes (PeLEDs) are considered as new-generation highly efficient luminescent materials for application in displays and solid-state lighting. Since the first successful demonstration of PeLEDs in 2014, the research on the development of efficient PeLEDs has progressed significantly. Although the device efficiency has significantly improved over a short period of time, their overall performance has not yet reached the levels of mature technologies for practical applications. Various degradation processes are the major impediment to improving the performance and stability of PeLED devices. In this review, we discuss various analysis techniques that are necessary to gain insights into the effects of various degradation mechanisms on the performance and stability of PeLEDs. Based on the causes and effects of external and internal factors, the degradation processes and associated mechanisms are examined in terms of critical physical and chemical parameters. Further, according to the progress of the current research, the challenges faced in studying degradation mechanisms are also elucidated. Given the universality of the degradation behavior, an in-depth understanding of the device degradation may promote the development of optimization strategies and further improve the performance and stability of PeLEDs.

Achieving highly efficient antisolvent- and annealing-free NIR perovskite light-emitting diodes by optimizing the gradient of preheating

“…35,37 Defects in perovskite films existing as non-radiative recombination centers can reduce carrier-recombination efficiency and lower PeLED device performance. 38,39 The optical uniformity of the reference and Rate Q-based perovskite films was then investigated using PL mapping in a 40 mm  40 mm area as shown in Fig. 4C and D (the PL mapping of other samples is presented in Fig.…”

“…35,37 Defects in perovskite films existing as non-radiative recombination centers can reduce carrier-recombination efficiency and lower PeLED device performance. 38,39…”

Dynamics in Blue Emitting Metal Halide Perovskites for Light Emitting Diodes

“…Diffusion of metallic species from the contacts, reacting with the perovskite, inducing non-radiative sites, or even shunting is another known problem, especially for metals used in blue emitting devices such as aluminum and silver 165 . LiF, a common interlayer is also known to dissociate and migrate into the active layer during operation generating leakage paths or defect centers 166 . Trapping of charges at interfaces, thermal instability, interfacial degradation, and quencher formation are general degradation mechanisms present in many LED-technologies 157 .…”

Abnormal Dynamic Reverse Bias Behavior and Variable Reverse Breakdown Voltage of ETL‐free Perovskite Solar Cells

“…[ 11 ] Although the general stability is constantly improved through various strategies, the reverse bias stability issue has not received sufficient attention yet. [ 5–7,12–14 ]…”

“…[11] Although the general stability is constantly improved through various strategies, the reverse bias stability issue has not received sufficient attention yet. [5][6][7][12][13][14] When the PV modules are working outdoors, some cells are likely to be shaded by snow, tree shade, bird droppings, and black clouds, etc. [15] Next, the shaded cells no longer act as a power output unit, but become a power dissipation diode.…”