2016
DOI: 10.1016/j.solmat.2016.08.006
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Degradation behavior of electrical properties of inverted metamorphic tri-junction solar cells under 1 MeV electron irradiation

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Cited by 24 publications
(11 citation statements)
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“…The main type of defects introduced via beam irradiation of charged particles in solar cell materials corresponds to displacement damage, including vacancies and interstitials. [ 28,29 ] The displacement damage dose ( DDD ) approach is used to evaluate the degradation of solar cells as an effective method. [ 30,31 ] Nonionizing energy‐loss ( NIEL) corresponds to the energy lost by an electron while penetrating the material.…”
Section: Resultsmentioning
confidence: 99%
“…The main type of defects introduced via beam irradiation of charged particles in solar cell materials corresponds to displacement damage, including vacancies and interstitials. [ 28,29 ] The displacement damage dose ( DDD ) approach is used to evaluate the degradation of solar cells as an effective method. [ 30,31 ] Nonionizing energy‐loss ( NIEL) corresponds to the energy lost by an electron while penetrating the material.…”
Section: Resultsmentioning
confidence: 99%
“…Here, we report some significant results among the many that have been achieved on the radiation resistance of MJSCs. [37,38,[136][137][138] In particular, Sharp et al [37] performed a study concerning the degradation of the PV parameters (short circuit current I SC , V OC , and maximum power P MAX ) of a lattice matched GaInP/GaAs/Ge 3JSC under irradiation by protons (with energies and fluences ranging, respectively, from 50 keV to 10 MeV and from ≈ 10 9 to ≈ 10 13 particles cm −2 ) and electrons (with energies of 1, 2, and 12 MeV and at fluences between ≈10 13 and ≈10 16 particles cm −2 ). As shown in Figure 4a-f, at fixed energy values for both ionizing radiations, the performance of the SC decreases with increasing fluences.…”
Section: Radiation Resistance Of Space Mjscsmentioning
confidence: 99%
“…The minority carrier lifetimes in the active layers of a solar cell are important parameters for evaluating the cell efficiency. Many studies have demonstrated that electron irradiation causes degradation of solar cell performance at the end‐of‐life (EOL) condition due to the irradiation generated displacement defects which form non‐radiative recombination centers and reduce the minority carrier lifetime 20‐22 . When the energy and type of the incident particles remained constant, the recombination center density was proportional to the irradiation particle fluence, which can be expressed by the equation N t = kφ , where N t is the density of the recombination center, φ is the fluence of the incident particle, and k is the number of non‐ionized recombination centers introduced by each particle on a unit path 23 .…”
Section: Simulation and Experimentsmentioning
confidence: 99%