2011
DOI: 10.1166/jnn.2011.3829
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Degradation and Failure of Field Emitting Carbon Nanotube Arrays

Abstract: It has been observed experimentally that the collective field emission from an array of Carbon Nanotubes (CNTs) exhibits fluctuation and degradation, and produces thermal spikes, resulting in electro-mechanical fatigue and failure of CNTs. Based on a new coupled multiphysics model incorporating the electron-phonon transport and thermo-electrically activated breakdown, a novel method for estimating accurately the lifetime of CNT arrays has been developed in this paper. The main results are discussed for CNT arr… Show more

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Cited by 5 publications
(6 citation statements)
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“…The increase in the voltage required to maintain 5 μA emission over time suggests gradual CNT field emitter degradation (Figure 2c). This degradation effect has been reported previously [28][29][30][31][32] and was related to several distinct causes, including shortening of the CNTs from ion bombardment and damage to the sidewalls from joule heating at the CNT tip during electron field emission. The voltage spikes observed in Figure 2c can be attributed to sudden changes in emission current forcing fast instrument correction to maintain the set current.…”
Section: Ex-situ Characterizationsupporting
confidence: 75%
See 1 more Smart Citation
“…The increase in the voltage required to maintain 5 μA emission over time suggests gradual CNT field emitter degradation (Figure 2c). This degradation effect has been reported previously [28][29][30][31][32] and was related to several distinct causes, including shortening of the CNTs from ion bombardment and damage to the sidewalls from joule heating at the CNT tip during electron field emission. The voltage spikes observed in Figure 2c can be attributed to sudden changes in emission current forcing fast instrument correction to maintain the set current.…”
Section: Ex-situ Characterizationsupporting
confidence: 75%
“…These sudden changes in emission current could be explained by CNTs undergoing deflection during the emitting process. It has been reported [32] that transients in emission current can be caused by electrodynamic interactions between field emitting CNTs. Deflected CNTs experiencing these interactions can undergo an abrupt pull, resulting in the sudden current changes.…”
Section: Ex-situ Characterizationmentioning
confidence: 99%
“…However, mechanisms of device failure must also be studied to improve device performance and lifetime. There have been numerous studies [69][70][71] on the failure mechanisms of standalone CNT field emitters that have identified several possible causes of failure.…”
Section: Improving Cnt Adhesion To Polysiliconmentioning
confidence: 99%
“…Examples include fracturing of the CNT tips during operation due to oxidative ablation of the CNTs caused by local resistive heating (i.e. thermo-mechanically activated fracture) [70,72], degradation due to ion irradiation/bombardment [73,74], and extraction of the CNT from the substrate due to either electrodynamic forces or increased resistive heating at the substrate-CNT interface [70,71]. In the case of CNT emitters grown on MEMS polysilicon-based substrates, poor adhesion between the CNT emitter and its substrate is the primary limiting factor for overall device lifetime.…”
Section: Improving Cnt Adhesion To Polysiliconmentioning
confidence: 99%
“…2 We assume that the nanotubes are placed into a homogeneous dielectric medium, nanotube axes are parallel to a common axis Ox, and the distance between neighboring nanotubes is large compared to 1350045-2 their diameter. While applications exist where this may not be the case, [17][18][19][20][21] the latter assumption allows us to neglect the interaction between nanotubes. Given the geometry, the dispersion law of conduction electrons in the nanotube has the form…”
Section: Basic Relations and The Wave Equationmentioning
confidence: 99%