2022
DOI: 10.1016/j.optlastec.2022.108339
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Deformation measurement in Al thin films at elevated temperatures by digital image correlation with speckles prepared by femtosecond laser

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Cited by 6 publications
(3 citation statements)
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“…This methodology enabled the assessment of the deformation of a C/C composite sample at 2000 8C within an inert atmosphere. Chen et al (2022b) devised a fully customizable speckle preparation technique utilizing pulsed laser technology, facilitating the creation of ideal speckle patterns with excellent contrast, consistency, and controllable impact on samples for deformation measurement at elevated temperatures through DIC. Laser speckle, in comparison to artificial speckle, emerges as a more promising alternative for conveying deformation information via digital image correlation at high temperatures, notably exceeding 1,600 8C.…”
Section: Review Of Digital Image Correlationmentioning
confidence: 99%
See 1 more Smart Citation
“…This methodology enabled the assessment of the deformation of a C/C composite sample at 2000 8C within an inert atmosphere. Chen et al (2022b) devised a fully customizable speckle preparation technique utilizing pulsed laser technology, facilitating the creation of ideal speckle patterns with excellent contrast, consistency, and controllable impact on samples for deformation measurement at elevated temperatures through DIC. Laser speckle, in comparison to artificial speckle, emerges as a more promising alternative for conveying deformation information via digital image correlation at high temperatures, notably exceeding 1,600 8C.…”
Section: Review Of Digital Image Correlationmentioning
confidence: 99%
“…This methodology enabled the assessment of the deformation of a C/C composite sample at 2000 °C within an inert atmosphere. Chen et al . (2022b) devised a fully customizable speckle preparation technique utilizing pulsed laser technology, facilitating the creation of ideal speckle patterns with excellent contrast, consistency, and controllable impact on samples for deformation measurement at elevated temperatures through DIC.…”
Section: Core Issues and Research Status In Dicmentioning
confidence: 99%
“…For instance, Grant et al [20] prepared the speckle patterns by abrading the sample surface with a 1200 grit silicon carbide paper to assure a homogeneous distribution of scratches without any preferential directions. In addition, customizable engraving speckles with femtosecond laser were also proposed for the DIC measurement at elevated temperatures [21]. Although both these two methods do not require additional speckle materials, the specimen surface could be damaged by the femtosecond laser or the silicon carbide paper, leading to the concentration of residual stress [11].…”
Section: Introductionmentioning
confidence: 99%