Deformable Polymer Dielectric Films in Phase Light Modulators

Luchnikov, P A; Vetrova, V V; Zubkov, N P; Surzhikova, O A; Chernova, N. I.

doi:10.1088/1757-899x/189/1/012027

Cited by 4 publications

(4 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“… a source of x-ray radiation -an x-ray tube;  detector of x-ray radiation [12];  the system of positioning with a working surface;  the software for processing of shadow images and formation of two or three-dimensional images, depending on a type of the x-ray tomograph [23];  a control system -a hardware and software system on management of system mechanics [24];…”

Section: Samples and Research Methodsmentioning

confidence: 99%

Calculation of Structural Parameters and Design of a Protective Shield for an X-Ray System

Plotnikova¹

2020

Eurasian phys. tech. j.

View full text Add to dashboard Cite

The need to calculate the radiation protection of the radiation system is the basis in which diagnostic, design or assembly activities are carried out as part of non-destructive testing. The paper provides an analysis of the design features of x-ray systems and their technical characteristics, operating conditions, diagnostic capabilities of modern tomographic systems. The dependences of the distribution of X-ray radiation and voltage on the thickness of the protective screen are given. The calculation of the thickness of the protective screen is presented, which will allow you to design the body of the protective screen of the x-ray system. The above studies will facilitate the work of specialists in the development of new modifications of x-ray systems.

show abstract

Section: Samples and Research Methodsmentioning

confidence: 99%

Calculation of Structural Parameters and Design of a Protective Shield for an X-Ray System

Plotnikova¹

2020

Eurasian phys. tech. j.

View full text Add to dashboard Cite

show abstract

“…The microhardness of the Knupp was determined by AFFRI DM-8 microhardnesser at a load of 490.3 mN and the pyramid pressing time of 10 s. The curvature of the coated substrate was determined by Bruker Dektak XT profilometer [8]. Through the pores and the surface topography of the film can be estimated by the method of registration of the inhomogeneity of the electric field in the capacitor [10].…”

Section: Samples and Research Methodsmentioning

confidence: 99%

The Structure and Mechanical Properties of Multilayer Metal-Carbon Coatings Deposited in Pulse Plasma of Arc Discharge

Piliptsou

Rogachev

Руденков

et al. 2018

KEM

View full text Add to dashboard Cite

The influence of the architecture of multilayer metal-carbon coatings, the nature of individual metallic layers (Ti, Cu), heat treatment parameters on their microhardness, the level of internal stresses and tribotechnical properties are determined. It is defined that for systems based on carbon and nanosized metal layers, the friction coefficient values are lower than for single-layer carbon coatings. Heat treatment of multilayer systems in air leads to the increase in the friction coefficient, primarily Ti/a-C/Ti coatings, which is due to the formation of solid phases of TiN, TiC and TiCN, as well as oxides of TixOy acting as abrasive. The level of internal stresses of multilayer systems containing layers of copper is lower than that of single-layer carbon coatings and coatings containing layers of titanium.

show abstract

“…Through the pores and the surface topography of the film can be estimated by the method of registration of the inhomogeneity of the electric field in the capacitor [12].…”

Section: Samples and The Experimental Methodsmentioning

confidence: 99%

Acquiring MIS Structures Based on Bа0.8Sr0.2TiО3 Ferroelectric Films and their Properties

Afanasyev

Nabiev

Чучева

et al. 2018

KEM

View full text Add to dashboard Cite

The paper considers formation of Ba0.8Sr0.2TiO3 ferroelectric films of MIS structures on silicon wafer with magnetron sputtering in HF discharge of the initial target material from the polycrystal ferroelectric in the oxygen atmosphere. Dielectric and volt-farad characteristics of MIS structures have been explored, depending on formation modes of Ba0.8Sr0.2TiO3 ferroelectric films. The authors determined technological modes of film deposition for acquiring MIS structures with the best electrophysical properties.

show abstract

Deformable Polymer Dielectric Films in Phase Light Modulators

Cited by 4 publications

References 9 publications

Calculation of Structural Parameters and Design of a Protective Shield for an X-Ray System

Calculation of Structural Parameters and Design of a Protective Shield for an X-Ray System

The Structure and Mechanical Properties of Multilayer Metal-Carbon Coatings Deposited in Pulse Plasma of Arc Discharge

Acquiring MIS Structures Based on Bа<sub>0.8</sub>Sr<sub>0.2</sub>TiО<sub>3 </sub>Ferroelectric Films and their Properties

Contact Info

Product

Resources

About