Deflection gating for time-resolved x-ray magnetic circular dichroism–photoemission electron microscopy using synchrotron radiation

Abstract

In this paper, we present a newly developed gating technique for a time-resolving photoemission microscope. The technique makes use of an electrostatic deflector within the microscope's electron optical system for fast switching between two electron-optical paths, one of which is used for imaging, while the other is blocked by an aperture stop. The system can be operated with a switching time of 20 ns and shows superior dark current rejection. We report on the application of this new gating technique to exploit the time structure in the injection bunch pattern of the synchrotron radiation source BESSY II at Helmholtz-Zentrum Berlin for time-resolved measurements in the picosecond regime.

X-Ray Imaging of Magnetic Structures

“…3) Lorentz TEM: The high spatial resolution in TEM makes them a very powerful tool to study thin magnetic films and nanopatterned structures, which are of primary interest both Compound SPLEEM images of Ni/[Co/Ni]2/Ir (111). Scale bar: 2 μm.…”

“…The fast point detector in STXM, e.g., an APD, allows utilizing fast single photon counting systems [110], while full-field soft X-ray microscopes require a fast gating of the 2-D detectors, e.g., a CCD. In X-PEEM, the emitted electrons can be directly used for that purpose [111], whereas in a photon-only MTXM, an additional photon-to-electron conversion stage, e.g., a phosphor, is required [112].…”