Defects in Advanced Electronic Materials and Novel Low Dimensional Structures 2018
DOI: 10.1016/b978-0-08-102053-1.00001-6
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Defects in ZnO

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Cited by 17 publications
(13 citation statements)
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“…It is obvious that each PL spectrum in Figure 3 consists of an ultraviolet PL band with its peak at about 378 nm and a green PL band with its peak at about 540 nm. The ultraviolet PL band is generally attributed to the band-edge recombination of excitons whereas the green PL band is produced by defects in ZnO [15][16][17][22][23][24][25]. Therefore, the higher fraction of the green PL intensity in the PL spectrum suggests the presence of higher defect density in ZnO nanorods.…”
Section: Resultsmentioning
confidence: 99%
“…It is obvious that each PL spectrum in Figure 3 consists of an ultraviolet PL band with its peak at about 378 nm and a green PL band with its peak at about 540 nm. The ultraviolet PL band is generally attributed to the band-edge recombination of excitons whereas the green PL band is produced by defects in ZnO [15][16][17][22][23][24][25]. Therefore, the higher fraction of the green PL intensity in the PL spectrum suggests the presence of higher defect density in ZnO nanorods.…”
Section: Resultsmentioning
confidence: 99%
“…There are many reports on the photoluminescence, Raman spectroscopy, and electrical properties of group III doped ZnO thin films grown by these techniques in the literature, and also extensive research on the impurity defects [6][7][8]. However, there are only a few reports on the bulk growth and properties of group-III doped ZnO crystals.…”
Section: Introductionmentioning
confidence: 99%
“…For example, these properties can be enhanced by doping with the following elements: Li, Mg, Al, Cu, W, etc. [3].…”
Section: Introductionmentioning
confidence: 99%