Defects Determination and Diagnosis in Bare Dice for High Reliable Hybrid Microcircuits

Lonkadi, Suma S; Varalakshmi, V; Raviprakash, S V; Singh, Kamal Deep; Nirmal, A V

doi:10.1109/icaecc54045.2022.9716627

2022 IEEE Fourth International Conference on Advances in Electronics, Computers and Communications (ICAECC) 2022

DOI: 10.1109/icaecc54045.2022.9716627

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Defects Determination and Diagnosis in Bare Dice for High Reliable Hybrid Microcircuits

Suma S Lonkadi¹,

V Varalakshmi²,

S V Raviprakash³

et al.

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Defects Determination and Diagnosis in Bare Dice for High Reliable Hybrid Microcircuits

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