2021
DOI: 10.1039/d0ma00902d
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Defect tolerant device geometries for lead-halide perovskites

Abstract: The term defect tolerance is widely used in literature to describe materials such as lead-halides perovskites, where solution-processed polycrystalline thin films exhibit long non-radiative lifetimes of microseconds or longer. Studies...

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Cited by 19 publications
(29 citation statements)
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“…This relation can easily be understood if we consider defectassisted recombination as a two-step capture process of both charge carrier types into the defect. [35,43] The slower of the two capture processes into a defect state determines the recombination rate. A higher lifetime corresponds to lower capture coefficients and slower capture rates.…”
Section: Doped Junctions With Asymmetric Carrier Lifetimesmentioning
confidence: 99%
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“…This relation can easily be understood if we consider defectassisted recombination as a two-step capture process of both charge carrier types into the defect. [35,43] The slower of the two capture processes into a defect state determines the recombination rate. A higher lifetime corresponds to lower capture coefficients and slower capture rates.…”
Section: Doped Junctions With Asymmetric Carrier Lifetimesmentioning
confidence: 99%
“…Another effect influencing the electric field distribution in the solar cell is the resistive loss from charge carrier transport. [35,54] In lead halide perovskite absorber layers, the mobilities of electrons and holes are sufficiently high to ignore resistive transport losses in the absorber. [55] However, some organic contact layers suffer from low conductivity.…”
Section: The Concept Of Dielectric Junctionsmentioning
confidence: 99%
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