2021
DOI: 10.1016/j.engfailanal.2020.104991
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Defect mapping of active layer of CdTe solar cells using charge deep level transient spectroscopy (Q-DLTS)

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Cited by 7 publications
(4 citation statements)
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“…For greater effectiveness in CdTe solar cells, it is necessary to maintain a minimum defect and to achieve a defect value of 1 × 10 14 cm −3 . This defect density value is achievable in comparison to the experimental investigation, [ 61–63 ] which demonstrated a defect density that is significantly less than this value. The experimental study specifies a defect value in the range of 1 × 10 9 to 1 × 10 13 cm −3 .…”
Section: Resultsmentioning
confidence: 67%
“…For greater effectiveness in CdTe solar cells, it is necessary to maintain a minimum defect and to achieve a defect value of 1 × 10 14 cm −3 . This defect density value is achievable in comparison to the experimental investigation, [ 61–63 ] which demonstrated a defect density that is significantly less than this value. The experimental study specifies a defect value in the range of 1 × 10 9 to 1 × 10 13 cm −3 .…”
Section: Resultsmentioning
confidence: 67%
“…Q-DLTS is the charge relaxation technique based on the measurement of transients produced during discharge time interval followed by required charging potential [48][49][50]. In our case, we have intentionally subjected the PVA electrolyte at ground zero potential and applied 1 V charging bias to the xyplane for a limited duration of * 10 ms. After this duration, the applied bias was removed and the device reduced its potential from 1 V to the ground zero in a time duration known as ''Discharge time.''…”
Section: Resultsmentioning
confidence: 99%
“…As a polycrystalline absorbing material, CdTe thin film exhibits many grain boundaries and inter-grain dislocations 8 . Defect mapping for CdTe material shows high recombination at 0.448 eV, 0.383 eV, 0.366 eV, and 0.341 eV located within the bandgap of CdTe 9 . Other works revealed that dislocations in the CdTe layer give a shallow to mid-level of around 0.17 eV or a deep level of about 0.7 eV below the conduction band 10 , 11 .…”
Section: Introductionmentioning
confidence: 99%