1981
DOI: 10.1016/0038-1098(81)90745-6
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Defect induced red shift in the luminescence spectra of amorphous silicon-hydrogen films

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1982
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Cited by 4 publications
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“…This result is in direct contrast with single-crystal 2H-WSe 2 for which the only observable PL is derived from the indirect bandgap transition at 850 nm (labeled I) . The small PL intensity from the A exciton peak of the nanoplates could be due to defects within the MX 2 plates that are allowing for a relaxation followed by radiative recombination that can lead to enhanced PL intensity. , Evidence of this relaxation to a defect state can be observed when comparing the PL data to optical absorbance data (Figure S7), as the A exciton peak in the PL spectra is red-shifted from that in the absorbance spectra . Further work is required to fully understand the source of the PL in the hexagonal nanoplates.…”
Section: Resultsmentioning
confidence: 99%
“…This result is in direct contrast with single-crystal 2H-WSe 2 for which the only observable PL is derived from the indirect bandgap transition at 850 nm (labeled I) . The small PL intensity from the A exciton peak of the nanoplates could be due to defects within the MX 2 plates that are allowing for a relaxation followed by radiative recombination that can lead to enhanced PL intensity. , Evidence of this relaxation to a defect state can be observed when comparing the PL data to optical absorbance data (Figure S7), as the A exciton peak in the PL spectra is red-shifted from that in the absorbance spectra . Further work is required to fully understand the source of the PL in the hexagonal nanoplates.…”
Section: Resultsmentioning
confidence: 99%