Defect Formation and Crossover Behavior in the Dynamic Scaling Properties of Molecular Beam Epitaxy

DasSarma, S.; Lanczycki, C. J.; Ghaisas, S. V.; Kim, J. M.

doi:10.48550/arxiv.cond-mat/9401043

1994

DOI: 10.48550/arxiv.cond-mat/9401043

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Defect Formation and Crossover Behavior in the Dynamic Scaling Properties of Molecular Beam Epitaxy

S. DasSarma¹,

C. J. Lanczycki²,

S. V. Ghaisas³

et al.

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Defect Formation and Crossover Behavior in the Dynamic Scaling Properties of Molecular Beam Epitaxy

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