Abstract:Scanning Spreading Resistance Microscopy (SSRM) is a well-known technique for electrical characterization of dopant distributions in semiconductors. The resistance between a conductive atomic force microscope (AFM) tip and a large area contact on a semiconductor sample gives direct hint of sample resistivity underneath the tip. The sample surface has to be polished to achieve a smooth surface which is crucial for a low ohmic electrical contact between tip and sample. In theory, the formula of spreading resista… Show more
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