Defect-Based Compact Modeling of Random Telegraph Noise

Weckx, Pieter; Kaczer, B.; Simicic, Marko; Parvais, B.; Linten, Dimitri

doi:10.1007/978-3-030-37500-3_16

Noise in Nanoscale Semiconductor Devices 2020

DOI: 10.1007/978-3-030-37500-3_16

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Defect-Based Compact Modeling of Random Telegraph Noise

Pieter Weckx¹,

B. Kaczer²,

Marko Simicic³

et al.

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Defect-Based Compact Modeling of Random Telegraph Noise

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References 26 publications

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