2016
DOI: 10.1103/physrevlett.116.233902
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Defect-Assisted Hard-X-Ray Microscopy with Capillary Optics

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Cited by 19 publications
(8 citation statements)
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“…2(b), grid-enhanced XCAMPO can achieve a submicrometer half-pitch resolution. This value is lower than the resolution of the recently proposed defect-assisted imaging technique26, that is limited mainly by the size of a single capillary aperture. In the present experiment, the resolution was mainly limited by the detector resolution.…”
Section: Discussionmentioning
confidence: 74%
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“…2(b), grid-enhanced XCAMPO can achieve a submicrometer half-pitch resolution. This value is lower than the resolution of the recently proposed defect-assisted imaging technique26, that is limited mainly by the size of a single capillary aperture. In the present experiment, the resolution was mainly limited by the detector resolution.…”
Section: Discussionmentioning
confidence: 74%
“…Previous XCAMPO approaches have used either a periodic superstructure of capillary bundles1519 or the intrinsic defects in polycapillary arrays26. Tailored polycapillaries with a defined capillary distribution are difficult to fabricate.…”
Section: Discussionmentioning
confidence: 99%
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“…Одним из возможных путей дальнейшего развития поликапиллярной оптики может стать придание ей функции изображающей оптики. Недавно была предложена дефектная микроскопия [190], использующая естественные дефекты поликапиллярных структур, такие как разрушенные, отсутствующие или чуть более крупные капилляры. Было продемонстрировано, что такие дефекты, нарушая периодичность капиллярных решеток, приводят непосредственно к формированию множественных рентгеновских изображений объекта, помещенного в фокусе поликапиллярной оптики.…”
Section: заключение выводы и перспективыunclassified