2022
DOI: 10.1126/sciadv.abn2275
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Deep sub-angstrom resolution imaging by electron ptychography with misorientation correction

Abstract: Superresolution imaging of solids is essential to explore local symmetry breaking and derived material properties. Electron ptychography is one of the most promising schemes to realize superresolution imaging beyond aberration correction. However, to reach both deep sub-angstrom resolution imaging and accurate measurement of atomic structures, it is still required for the electron beam to be nearly parallel to the zone axis of crystals. Here, we report an efficient and robust method to correct the specimen mis… Show more

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Cited by 30 publications
(27 citation statements)
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“…Ptychographic reconstruction were performed using the EMPTY program (Beijing Superresolution Technology Co., Ltd.), which implements the adaptive-propagator ptychography method 42 and is GPU-accelerated. The real space pixel size in the transmission function is 0.14 Å. Mixed-state algorithm 35 , 67 with six probe modes were used, which were shown in Supplementary Fig.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Ptychographic reconstruction were performed using the EMPTY program (Beijing Superresolution Technology Co., Ltd.), which implements the adaptive-propagator ptychography method 42 and is GPU-accelerated. The real space pixel size in the transmission function is 0.14 Å. Mixed-state algorithm 35 , 67 with six probe modes were used, which were shown in Supplementary Fig.…”
Section: Methodsmentioning
confidence: 99%
“…Capable of imaging both heavy and light atoms 41 , it becomes a powerful tool to investigate oxide materials. Very recently, the adaptive-propagator (APP) method 42 was developed in the frame of multislice electron ptychography 34 , 43 to remove the misorientation effect. It suggests possible application of deep-sub-angstrom resolution ptychographic imaging in real materials with intrinsic variation of crystal orientation around defects like dislocations and interfaces.…”
Section: Introductionmentioning
confidence: 99%
“…At present, temperature-and electric-field-dependent in situ experiments can be conducted by the TEM [103,104], which enable the detection of the domain-wall evolution during the temperature variation or under the electric-field stimulation, respectively. Sha et al [105] recently reported a novel TEM technique, where a deep sub-angstrom resolution imaging with a misorientation correction was developed to largely reduce the experimental difficulties of electron ptychography. The development of detectors also led to advanced imaging modes, such as differential phase contrast and fourdimension scanning transmission electron microscopy (4D-STEM) [106,107].…”
Section: Possible Solutionsmentioning
confidence: 99%
“…The redundancy of the 4D-STEM dataset allows the correction of experimental imperfections and aberrations through reconstruction. For example, position correction , and zone-axis correction have been realized using modified algorithms. In addition, the multislice , and mixed-state methods, , which can be integrated into iterative algorithms (e.g., ePIE and ML algorithms), have been developed to address the problems of multiple scattering associated with thick specimens and the partial incoherence of electron beams, respectively.…”
Section: Data Acquisition and Processing Of 4d-stem Ptychographymentioning
confidence: 99%
“…The ability of various existing algorithms to manage ultra-low-dose large-defocus data should be explored, and new algorithms that can meet these requirements should also be developed. Several methods for scanning coordinate correction , and zone-axis correction have been developed to tolerate imperfect experimental conditions to a certain extent. These methods are potentially valuable for highly beam-sensitive materials that require rapid operation without time to perfect the imaging conditions.…”
Section: Conclusion and Outlookmentioning
confidence: 99%