2024 IEEE Applied Power Electronics Conference and Exposition (APEC) 2024
DOI: 10.1109/apec48139.2024.10509140
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Deep Investigation on SiC MOSFET Degradation under Gate Switching Stress and Application Switching Stress

Alexis A. Gómez,
Juan R. García-Meré,
Alberto Rodríguez
et al.
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