Decreasing Test Qualification Time in AMS and RF Systems

Joannon, Yves; Beroulle, Vincent; Robach, Chantal; Tedjini, Smaïl; Carbonero, J.L.

doi:10.1109/mdt.2008.7

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Fault Modeling and Structural Test1

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“…For a given fault model, the structural test generation problem boils down to generating a set of tests that detect all faults in the model. To this end, many test generation algorithms have been written to craft a test stimulus and select the output test signature such that the distance between the functional circuits and the faulty circuits is maximized [123,124,125,126,127,128,129,130,131].…”

Section: Fault Modeling and Structural Testmentioning

confidence: 99%