2014
DOI: 10.1016/j.electacta.2014.08.027
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Deconvolution of the Partial Anodic and Cathodic Processes during the Corrosion of Carbon Steel in Concrete Pore Solution under Simulated Anoxic Conditions

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Cited by 43 publications
(39 citation statements)
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“…Although the partial anodic current density is predicted to be independent of E app , there exists a competition between partial anodic and partial cathodic currents in determining the total (observed) current [21]. This observation has been made by other authors [21,28] and shows the importance of considering the cathodic current produced by hydrogen evolution due to the water reduction in deaerated condition when considering the electrochemistry of reactive metals, such as Al, Li, Mg, and Zn.…”
Section: Resultsmentioning
confidence: 62%
“…Although the partial anodic current density is predicted to be independent of E app , there exists a competition between partial anodic and partial cathodic currents in determining the total (observed) current [21]. This observation has been made by other authors [21,28] and shows the importance of considering the cathodic current produced by hydrogen evolution due to the water reduction in deaerated condition when considering the electrochemistry of reactive metals, such as Al, Li, Mg, and Zn.…”
Section: Resultsmentioning
confidence: 62%
“…Based on the proposed equivalent electrical circuit, the total impedance of the interfacial system is written as: where Z cath and Z ol are the impedance of the cathodic-reaction branch and the outer-layer. The theory of the MPM, the detailed derivation of Z F , Z W , and the optimization procedure of the MPM and the PDM on impedance data have been elaborated elsewhere 29,60 and hence they will not be repeated here due to space limitations.…”
Section: Modelling and Optimization Of The Modelmentioning
confidence: 99%
“…The results obtained by this method match fairly well with those calculated from the optimization, despite some minor difference which possibly originates from the over-simplified "parallel plate capacitor" assumption for the film, or, alternatively, is a reflection of the existence of the outer-layer. 29 Point defect diffusivity.-The diffusivity of the point defects within the barrier layer can be evaluated via the PDM from the equation given below 78 :…”
Section: Modelling and Optimization Of The Modelmentioning
confidence: 99%
“…In the potential range of around -0.3 to 0.0 V SCE , the slopes of the curves are positive, suggesting an n-type semiconductor behavior. According to the point defect model [7,8], the lowered slope and the enlarged carrier density with the increasing temperature indicates the lowered ability of corrosion resistance. In contrast, the slope of the curve is increased by Al addition into the exposed solution with the same exposure temperature.…”
Section: Resultsmentioning
confidence: 99%