The decomposition of toxic flotation reagents upon UV
185+254 nm
irradiation was attractive due to operational simplicity and no dosage of oxidants. In this work, the degradation of typical thiol collectors (potassium ethyl xanthate (PEX), sodium diethyl dithiocarbamate (SDD),
O
-isopropyl-
N
-ethyl thionocarbamate (IET) and dianilino dithiophoshoric acid (DDA)) was investigated by UV
185+254 nm
photolysis. The degradation efficiencies and mineralization extents of collectors were assessed. The formation of CS
2
and H
2
S byproducts was studied, and the mechanisms of collector degradation were proposed under UV
185+254 nm
irradiation. The PEX, SDD and IET were decomposed with nearly 100% removal upon 75 min of UV
185+254 nm
irradiation. The decomposition rate constants decreased in the order SDD > PEX > IET ≫ DDA, and the DDA was the refractory collector. After 120 min of UV
185+254 nm
irradiation, 15−45% of carbon and 25−75% of sulfur of collectors were completely mineralized, and the mineralization extent decreased in the order PEX > SDD > IET > DDA. The percentage of gaseous sulfur (CS
2
and H
2
S) ranged from 0.48 to 4.85% for four collectors, showing the fraction of emitted sulfur byproducts was small. The aqueous CS
2
concentration increased in the first 10−20 min, and was decreased to a low level of 0.05–0.1 mg l
−1
at 120 min. Two mechanisms, i.e. direct UV
254 nm
photolysis and indirect oxidation with free radicals, were responsible for collector decomposition in the UV
185+254 nm
photolysis.