2017
DOI: 10.1002/adfm.201700331
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Dealloying in Individual Nanoparticles and Thin Film Grains: A Bragg Coherent Diffractive Imaging Study

Abstract: Dealloying is a process whereby selective dissolution results in a porous, strained structure often with new properties. The process is of both intrinsic and applied interest, and recently has been used to make highly active catalysts. The porosity has been studied using electron microscopy while the dealloying-induced strain has been studied at the ensemble level using X-ray diffraction. Despite the importance of local, for example, at the individual particle or grain level, strain in controlling the properti… Show more

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Cited by 23 publications
(19 citation statements)
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“…Under the assumption, we define the compositional strain, like the elastic strain [16], as the longitudinal component of the gradient of the displacement field, u111(r) as…”
Section: Resultsmentioning
confidence: 99%
“…Under the assumption, we define the compositional strain, like the elastic strain [16], as the longitudinal component of the gradient of the displacement field, u111(r) as…”
Section: Resultsmentioning
confidence: 99%
“…A binary alloy was chosen for this study to identify how strain distributions can be affected by the presence of another element during corrosion. 23,24 BCDI allows 3D-resolved, nanoscale strain measurements with a 3D spatial resolution of 10–30 nm and a strain resolution on the order of ∼2 × 10 –4 , 25 making it well suited to probing crystal defects and morphology. Currently, at third generation synchrotron light sources, several minutes are required to collect a BCDI dataset.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, nanoparticle crystals or nanograins have been widely studied using X-ray beams tightly focused to maximize diffraction intensity, for example, in coherent diffraction imaging (Cha et al, 2017;Liu et al, 2017;Ulvestad et al, 2017) and Bragg ptychography (Hruszkewycz et al, 2013). In these cases, the beam sizes are typically close to or less than a micrometre.…”
Section: Introductionmentioning
confidence: 99%