Dead time duration and active reset influence on the afterpulse probability of InGaAs/InP single-photon avalanche diodes
A. V. Losev,
V. V. Zavodilenko,
A. A. Koziy
et al.
Abstract:We perform the detailed study of the afterpulse probability's dependence in the InGaAs/InP sine-gated SPAD on the dead time and the used approach for its implementation. We have found that the comparator's simple latching can significantly reduce afterpulses' probability, even without using a dead time pulse that lowers the diode bias voltage. We have found that with a low probability of afterpulse (< 5 %) or with a large dead time (τ > 10 µs), it is sufficient to use a circuit with latching of the comparator,… Show more
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