DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems

Muldrey, Barry; Deyati, Sabyasachi; Chatterjee, Abhijit

doi:10.1109/test.2016.7805868

2016 IEEE International Test Conference (ITC) 2016

DOI: 10.1109/test.2016.7805868

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DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems

Barry Muldrey

Sabyasachi Deyati

Abhijit Chatterjee

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2022

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Cited by 1 publication

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DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems

Cited by 1 publication

References 19 publications

ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug of AMS Circuits

ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug of AMS Circuits

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