De-embedding parasitic components from propagation constant calculations

Farcich, Nick J.; Asbeck, P.M.

doi:10.1016/j.aeue.2008.01.011

Cited by 3 publications

(2 citation statements)

References 16 publications

(15 reference statements)

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“…In our protocol, they are intermediate ones from which we extract the complex propagation constant with an appropriate de-embedding home made software. 20,21 The real and imaginary components of this complex value are respectively dedicated to the attenuation and to the phase constant of the mode which propagates. From a numerical point of view, we have implemented a second home made numerical software based on a two dimensional tangential vector finite element method named "ELFI."…”

Section: B Protocol Overview For Measurement and Extraction Of Bst Th...mentioning

confidence: 99%

Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method

Ponchel

Midy

Legier

et al. 2010

Journal of Applied Physics

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( Ba , Sr ) TiO 3 (BST) thin films were deposited on high resistivity silicon substrates by in situ rf magnetron sputtering. A buffer layer was used to improve the cristallinity of the films, the composition was fixed to Ba/Sr=30/70. The relative permittivity and the losses were measured up to 60 GHz using coplanar strip lines. The dispersion of the permittivity and the losses has been determined with a home made numerical code based on finite elements: ELFI. We show that, with the measurements of the scattering parameters coupled with ELFI, it is possible to know the BST complex permittivity over a very broad frequency band. The BST films deposited by in situ (700 °C) present excellent properties between 1 to 60 GHz. The relative permittivity is in the order of 270 and the losses are very small 0.09 at 60 GHz. These structures BST/silicon high resistivity show good potentialities for devices microwaves applications which need future integration in a silicon environment.

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Section: B Protocol Overview For Measurement and Extraction Of Bst Th...mentioning

confidence: 99%

Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method

Ponchel

Midy

Legier

et al. 2010

Journal of Applied Physics

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show abstract

“…Microwave non-resonant methods can also be separated into two groups as a) calibration-dependent methods and b) semi-calibration-independent methods [40][41][42][43][44][45][46][47][48][49][50][51][52][53][54][55]. The advantages of methods in the latter group over those in the former one are that their accuracy can be improved by avoiding the usage of imperfect calibra-0263-2241/$ -see front matter Ó 2010 Elsevier Ltd. All rights reserved.…”

Section: Introductionmentioning

confidence: 99%

A microwave method based on amplitude-only reflection measurements for permittivity determination of low-loss materials

Hasar

Yurtcan

2010

Measurement

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Soft‐lithography defined coaxial‐like transmission line with 2.5 dimensional features

Farcich

Asbeck

2008

Micro & Optical Tech Letters

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transmission measurement has been done by a set of standard high-gain microwave horn antennas, see Figure 1. In this case, the component of the magnetic field along z disappears because we are dealing with a quasi TEM wave, remaining only E y and H x . Therefore, previous free space measurements focused in the quasistatic resonance [9], are extended here to the study of high-order resonances.Measurements of the transmission have been done both in waveguide and in free space conditions with the experimental measurement set-ups described earlier. A reasonable agreement between simulation and measurement results can be observed in both free-space and waveguide scenario, see Figures 2(a) and 2(b), respectively. Needless to say, there are some differences between the waveguide and free space results due to the very different nature of the exciting mode fields TE 10 and TEM. To deepen in the origin of the resonances, the current densities for both exciting polarizations were simulated see Figure 3. In panel (a) are depicted the results obtained in the free-space situation (see caption to identify each resonance). Note that at the first resonance, as it was expected, the current density appears in both rings and its sense is antisymmetric, the second is symmetric, and for the third one only the outer ring is excited. For cross-polar excitation, the first and second ones are symmetric. For waveguide excitation, panel (b), the resonance patterns follow the same rules as in free space case with some minor changes in the induced current magnitude. In contrast with the planar circuit technology results given in [7], the high order resonance surface current patterns of Figure 3 evidence much more complexity than those corresponding to isolated single ring resonances. This would be explained because of the very different nature of the exciting waveguide and free space fields. An alternative explanation based on periodicity Bragg gaps is given in [10] and also, a study for U-shaped particles can be found in [11]. The obtained results could stimulate very promising future metamaterial applications as described in [12]. CONCLUSIONSIn summary, using simulation and experimental techniques, we have reported further results on the behavior of the high-order resonances of SRRs placed inside monomode waveguides and in free space conditions for both co-and cross-polar excitation. These results can stimulate in depth theoretical studies on the nature of the high order resonances under waveguide and free space excitation which are very promising for future metamaterial applications. ACKNOWLEDGMENTThis work is, in part, supported by AECI project under contract A/6851/06 and by grants awarded to Mariem Aznabet and Otman El Mrabet. Also we acknowledge the support of the Spanish Government and E.U. FEDER under contract TEC2005-06923-C03-01. integrated circuits. Of these, coplanar waveguides are the transmission line of choice because of their wide-bandwidth, singlemode operation, and low-loss characteristics. Recently, researchers have exte...

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De-embedding parasitic components from propagation constant calculations

Cited by 3 publications

References 16 publications

Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method

Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method

A microwave method based on amplitude-only reflection measurements for permittivity determination of low-loss materials

Soft‐lithography defined coaxial‐like transmission line with 2.5 dimensional features

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