De-Embedding and Unterminating

Bauer, R.F.; Penfield, P.

doi:10.1109/tmtt.1974.1128212

Cited by 172 publications

(74 citation statements)

References 3 publications

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“…A deembedding technique [8] was applied to the measurements to remove the impact of transitions. The deembedding proposed in [9] is used in this paper.…”

Section: Waveguide Characterizationmentioning

confidence: 99%

Line Defect-Layered EBG Waveguides in Dielectric Substrates

Ouassal

Shaker

Roy

et al. 2018

International Journal of Antennas and Propagation

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A dielectric-based multilayer structure composed of U-shaped rings (ML-UR) is used to develop a class of novel electromagnetic band gap (EBG) slab waveguide. The structure has two band gaps that narrow down as dielectric constant is increased. The EBG slab waveguide is created by embedding a single-layer line defect inside the 3D crystal of the EBG slab guide. Unlike our previously published foam-based EBG structure, the use of dielectric spacer in the EBG waveguides offers significant advantages in terms of overall size, structure reliability, and design flexibility. The waveguide structures reported in this paper are designed to operate at X-band (8-12 GHz) while being fed by coplanar-slotline transitions. Prototypes were fabricated and characterized experimentally. The insertion loss decreases by decreasing the number of full lattices of ML-UR surrounding the channels. The proposed waveguide has potential in microwave components such as directional couplers, phase shifters, and antenna array feeding networks.

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“…A deembedding technique [8] was applied to the measurements to remove the impact of transitions. The deembedding proposed in [9] is used in this paper.…”

Section: Waveguide Characterizationmentioning

confidence: 99%

Line Defect-Layered EBG Waveguides in Dielectric Substrates

Ouassal

Shaker

Roy

et al. 2018

International Journal of Antennas and Propagation

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“…This process is related to "deembedding" or the process of inferring the response of a device under test when electrical properties of the intervening structure (in this case, the feedline coupling structure) are known. 43 Elegant implementations of such concepts in the context of scalar millimeter-wave circuit metrology are described in Refs. 44 and 45. To model the 2-resonator device response below the instrument termination plane (Fig.…”

Section: Abcd-matrix Modelmentioning

confidence: 99%

Analysis and calibration techniques for superconducting resonators

Cataldo

Wollack

Barrentine

et al. 2015

Review of Scientific Instruments

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A method is proposed and experimentally explored for in-situ calibration of complex transmission data for superconducting microwave resonators. This cryogenic calibration method accounts for the instrumental transmission response between the vector network analyzer reference plane and the device calibration plane. Once calibrated, the observed resonator response is analyzed in detail by two approaches. The first, a phenomenological model based on physically realizable rational functions, enables the extraction of multiple resonance frequencies and widths for coupled resonators without explicit specification of the circuit network. In the second, an ABCD-matrix representation for the distributed transmission line circuit is used to model the observed response from the characteristic impedance and propagation constant. When used in conjunction with electromagnetic simulations, the kinetic inductance fraction can be determined with this method with an accuracy of 2%. Datasets for superconducting microstrip and coplanar-waveguide resonator devices were investigated and a recovery within 1% of the observed complex transmission amplitude was achieved with both analysis approaches. The experimental configuration used in microwave characterization of the devices and self-consistent constraints for the electromagnetic constitutive relations for parameter extraction are also presented.

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“…Characterizing these devices poses a challenge since they cannot be characterized by use of a single vector network analyzer (VNA) calibration. Several methods [1][2][3][4][5], including the well-known adapter-removal technique [6], have been developed over the years for characterizing noninsertable adapters and probes. However, none of them are adequate on their own when the noninsertable device transmits power in one direction only, such as an isolator or amplifier.…”

Section: Introductionmentioning

confidence: 99%

Characterizing a noninsertable directional device using the NIST uncertainty framework

Jargon

Williams

Hale

et al. 2014

83rd ARFTG Microwave Measurement Conference

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-We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of a chain of components, including a coaxial-towaveguide adapter, a waveguide band-pass filter, a waveguide low-noise amplifier, a waveguide isolator, and a waveguide taper. With the aforementioned directional components, the wellknown adapter removal technique is not adequate on its own for characterizing our device. In this paper, we describe and implement our method, and propagate the uncertainties from the two required calibrations to the characterized device.

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De-Embedding and Unterminating

Cited by 172 publications

References 3 publications

Line Defect-Layered EBG Waveguides in Dielectric Substrates

Line Defect-Layered EBG Waveguides in Dielectric Substrates

Analysis and calibration techniques for superconducting resonators

Characterizing a noninsertable directional device using the NIST uncertainty framework

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