Dark current fixed pattern noise reduction for the 2/3-in two-million pixel HDTV STACK-CCD imager

Sakaguchi, Naofumi; Nakamura, Nobuo; Ohsawa, Shinji; Endo, Yukio; Matsunaga, Y.; Ooi, Kazushige; Yoshida, Okio

doi:10.1109/16.628819

Cited by 3 publications

(3 citation statements)

References 9 publications

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“…In this simulation, the photo‐response nonuniformity noise (systematic spatial variation in pixel efficiency) and the dark current fixed pattern noise (systematic spatial variation in dark current) are not considered as they are small compared with the noises involved. These effects are caused by pixel manufacturing defects, such as surface defects at the SiO 2 /Si interface and randomly distributed discrete charge generation centers . The parameters used in the photon sensor model are given in Table .…”

Section: Methodsmentioning

confidence: 99%

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Performance evaluation of ¹⁸F radioluminescence microscopy using computational simulation

et al. 2017

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Purpose Radioluminescence microscopy can visualize the distribution of beta-emitting radiotracers in live single cells with high resolution. Here, we perform a computational simulation of 18F positron imaging using this modality to better understand how radioluminescence signals are formed and to assist in optimizing the experimental setup and image processing. Methods First, the transport of charged particles through the cell and scintillator and the resulting scintillation is modeled using the GEANT4 Monte-Carlo simulation. Then, the propagation of the scintillation light through the microscope is modeled by a convolution with a depth-dependent point-spread function, which models the microscope response. Finally, the physical measurement of the scintillation light using an electron-multiplying charge-coupled device (EMCCD) camera is modeled using a stochastic numerical photosensor model, which accounts for various sources of noise. The simulated output of the EMCCD camera is further processed using our ORBIT image reconstruction methodology to evaluate the endpoint images. Results The EMCCD camera model was validated against experimentally acquired images and the simulated noise, as measured by the standard deviation of a blank image, was found to be accurate within 2% of the actual detection. Furthermore, point-source simulations found that a reconstructed spatial resolution of 18.5 μm can be achieved near the scintillator. As the source is moved away from the scintillator, spatial resolution degrades at a rate of 3.5 μm per μm distance. These results agree well with the experimentally measured spatial resolution of 30–40 μm (live cells). The simulation also shows that the system sensitivity is 26.5%, which is also consistent with our previous experiments. Finally, an image of a simulated sparse set of single cells is visually similar to the measured cell image. Conclusions Our simulation methodology agrees with experimental measurements taken with radioluminescence microscopy. This in silico approach can be used to guide further instrumentation developments and to provide a framework for improving image reconstruction.

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Section: Methodsmentioning

confidence: 99%

“…These effects are caused by pixel manufacturing defects, such as surface defects at the SiO 2 /Si interface and randomly distributed discrete charge generation centers. [29][30][31] The parameters used in the photon sensor model are given in Table IV.…”

Section: D Emccd Camera Modelmentioning

confidence: 99%

Performance evaluation of ¹⁸F radioluminescence microscopy using computational simulation

et al. 2017

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“…Pixels in a hardware photosensor cannot be manufactured exactly the same from perfectly pure materials. There will always be variations in the photo detector area that are spatially uncorrelated [46], surface defects at the SiO 2 /Si interface [47], and discrete randomlydistributed charge generation centres [11]. These defects provide a mechanism for thermally-excited carriers to move between the valence and conduction bands [48,49].…”

Section: Dark Current Fixed Pattern Noisementioning

confidence: 99%

High-level numerical simulations of noise in CCD and CMOS photosensors: review and tutorial

Konnik,

Welsh

2014

Preprint

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In many applications, such as development and testing of image processing algorithms, it is often necessary to simulate images containing realistic noise from solid-state photosensors. A high-level model of CCD and CMOS photosensors based on a literature review is formulated in this paper. The model includes photoresponse non-uniformity, photon shot noise, dark current Fixed Pattern Noise, dark current shot noise, offset Fixed Pattern Noise, source follower noise, sense node reset noise, and quantisation noise. The model also includes voltage-to-voltage, voltage-to-electrons, and analogue-to-digital converter non-linearities. The formulated model can be used to create synthetic images for testing and validation of image processing algorithms in the presence of realistic images noise. An example of the simulated CMOS photosensor and a comparison with a custom-made CMOS hardware sensor is presented. Procedures for characterisation from both light and dark noises are described. Experimental results that confirm the validity of the numerical model are provided. The paper addresses the issue of the lack of comprehensive high-level photosensor models that enable engineers to simulate realistic effects of noise on the images obtained from solid-state photosensors.

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A low dark current double membrane poly-Si FT-technology for 2/3 inch 6M pixel CCD imagers

Peek

Verbugt²,

Heijns³

International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318)

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Dark current fixed pattern noise reduction for the 2/3-in two-million pixel HDTV STACK-CCD imager

Cited by 3 publications

References 9 publications

Performance evaluation of ¹⁸F radioluminescence microscopy using computational simulation

Performance evaluation of ¹⁸F radioluminescence microscopy using computational simulation

High-level numerical simulations of noise in CCD and CMOS photosensors: review and tutorial

A low dark current double membrane poly-Si FT-technology for 2/3 inch 6M pixel CCD imagers

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Dark current fixed pattern noise reduction for the 2/3-in two-million pixel HDTV STACK-CCD imager

Cited by 3 publications

References 9 publications

Performance evaluation of 18F radioluminescence microscopy using computational simulation

Performance evaluation of 18F radioluminescence microscopy using computational simulation

High-level numerical simulations of noise in CCD and CMOS photosensors: review and tutorial

A low dark current double membrane poly-Si FT-technology for 2/3 inch 6M pixel CCD imagers

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Performance evaluation of ¹⁸F radioluminescence microscopy using computational simulation

Performance evaluation of ¹⁸F radioluminescence microscopy using computational simulation