2007
DOI: 10.1063/1.2734366
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Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5nm wavelength

Abstract: Samples of B4C, amorphous C, chemical-vapor-deposition-diamond C, Si, and SiC were exposed to single 25fs long pulses of 32.5nm free-electron-laser radiation at fluences of up to 2.2J∕cm2. The samples were chosen as candidate materials for x-ray free-electron-laser optics. It was found that the threshold for surface damage is on the order of the fluence required for thermal melting. For larger fluences, the crater depths correspond to temperatures on the order of the critical temperature, suggesting that the c… Show more

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Cited by 72 publications
(33 citation statements)
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“…14 A rough estimate of the dose required to damage a material is to absorb enough energy to raise the material's temperature from room temperature to its melting point. 15 For ruthenium, this absorbed energy dose is 1.01 eV/atom 16 and for B 4 C this dose threshold is 3.7 eV/atom. 17 However, as Xray optic coating are thin films, care must be given to investigate and understand the interfaces between the film and the substrate.…”
mentioning
confidence: 99%
“…14 A rough estimate of the dose required to damage a material is to absorb enough energy to raise the material's temperature from room temperature to its melting point. 15 For ruthenium, this absorbed energy dose is 1.01 eV/atom 16 and for B 4 C this dose threshold is 3.7 eV/atom. 17 However, as Xray optic coating are thin films, care must be given to investigate and understand the interfaces between the film and the substrate.…”
mentioning
confidence: 99%
“…We estimate the error in the damage threshold to be about 50% due to errors in the beam area, the energy measurements of the gas detector, and the small number of exposure per exposure series. Thresholds of inorganic materials [1] are at least one order of magnitude higher that the threshold found with the same radiation in an organic polymer [2]. This is not surprising because inorganic solids exhibit in general higher thermal as well as radiation resistance.…”
mentioning
confidence: 76%
“…Uncertainties in the measurements are due to errors in the GMD data (around 10%) [23], to a decrease in the mirror reflectivity during this experiment (from 67% to 50%) [22], and to an uncertainty in the exact sample position (z) relative to the focal plane. The uncertainty in the position affects calculated power densities by up to 30% when the sample was close to the best focus.…”
Section: Resultsmentioning
confidence: 99%