The Chemistry of Metal CVD 1994
DOI: 10.1002/9783527615858.ch4
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CVD of Copper from Cu(II) Precursors

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Cited by 16 publications
(9 citation statements)
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“…As reported by Lai et al [2] and Griffin and Haverick [3], the introduction of H(hfac) vapor into a system containing Cu(hfac) 2 reduces the deposition rate, which was interpreted as evidence that the rate of the process was limited by H(hfac) desorption from the substrate surface. According to Norman [6], significant H(hfac) additions slightly reduce the deposition rate of Cu from Cu(hfac)L, where L is a neutral organic ligand and the charge state of Cu is 1+.…”
Section: Introductionmentioning
confidence: 88%
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“…As reported by Lai et al [2] and Griffin and Haverick [3], the introduction of H(hfac) vapor into a system containing Cu(hfac) 2 reduces the deposition rate, which was interpreted as evidence that the rate of the process was limited by H(hfac) desorption from the substrate surface. According to Norman [6], significant H(hfac) additions slightly reduce the deposition rate of Cu from Cu(hfac)L, where L is a neutral organic ligand and the charge state of Cu is 1+.…”
Section: Introductionmentioning
confidence: 88%
“…Bykov et al [4] and Turgambaeva et al [5] analyzed the gaseous products of the heterogeneous decomposition of Cu(dpm) 2 vapor under dynamic vacuum at 250-550 ° C on the wall of a stainless-steel reactor covered with a copper film and the decomposition products of the complex. Using mass spectrometry, they identified a number of Cu-containing species: [ Cu ( dpm )-C ( CH 3 ) 3 ] + , [ Cu ( Hdpm )] + , [ Cu ( dpm ) 2 -2 C ( CH 3 ) 3 ] + , and [ Cu ( dpm ) 2 3 ] + ( III ), and [ H ( dpm )] + ( IV ). The signal intensities for II -IV in the mass spectrum were 40% relative to that for I (100%).…”
Section: Introductionmentioning
confidence: 99%
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“…The addition of H(dpm) was shown to reduce the apparent activation energy of the process to 10 ± 5 kJ/mol and to raise the deposition rate of Cu in the temperature range 250-310 ° C [3,4]. As reported by Griffin and Haverick [5], the introduction of H 2 O vapor into a system containing copper(II) hexafluoroacetylacetonate, Cu(hfac) 2 , accelerates the Cu deposition rate. Cu deposition from Cu(hfac)L, where L is a neutral ligand, in the presence of H 2 O was reported to enhance the adhesion between the film and substrate and to accelerate the deposition rate [6].…”
Section: Introductionmentioning
confidence: 91%
“…Metal-organic chemical vapour deposition (MOCVD), in which metal species are deposited on supports through the gaseous metal precursor, has been widely used in the semiconductor [33]. Recently, it has been considered to be applied to the catalyst preparation, because MOCVD allows growing thin coating with a uniform thickness on some complex topographical surfaces at relatively low temperatures.…”
Section: Introductionmentioning
confidence: 99%